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Paper Abstract and Keywords
Presentation 2026-03-05 13:25
[Memorial Lecture] FIawase: A SET Fault Injection Framework Towards Exhaustive System-Level Impact Evaluation
Zhang Mingtao, Cheng Quan, Hashimoto Masanori (Kyoto Uni.) VLD2025-91 HWS2025-87 ICD2025-102
Abstract (in Japanese) (See Japanese page) 
(in English) Single-event transients (SETs) threaten modern reliability-demanding SoCs equipped with error correction codes (ECC) for single event upset (SEU) mitigation. However, conventional gate-level SET fault injection (FI) remains prohibitively slow for practical reliability evaluation. This work presents FIawase, a high-throughput SET injection framework that enables comprehensive system-level evaluation of SET-induced soft errors. FIawase consists of two phases: a netlist-level inject-and-capture simulation, which systematically flips the output of every gate–cycle pair during program execution to record flip-flop changes one cycle later, and a scan-chain-based replay-and-measure emulation, which replays these patterns at hardware speed to quantify system-level impact. Implemented on an open-source RISC-V system, FIawase reduces a comprehensive SET injection campaign from decades of pure simulation to nearly a day, achieving over four orders of magnitude end-to-end speedup. FIawase takes a critical first step toward exhaustive, cycle-accurate SET analysis, enabling architectural and reliability research at previously infeasible scales.
Keyword (in Japanese) (See Japanese page) 
(in English) Reliability / Fault Injection / Soft Errors / / / / /  
Reference Info. IEICE Tech. Rep., vol. 125, no. 382, VLD2025-91, pp. 90-96, March 2026.
Paper # VLD2025-91 
Date of Issue 2026-02-25 (VLD, HWS, ICD) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2025-91 HWS2025-87 ICD2025-102

Conference Information
Committee ICD HWS VLD  
Conference Date 2026-03-04 - 2026-03-07 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To VLD 
Conference Code 2026-03-ICD-HWS-VLD 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) FIawase: A SET Fault Injection Framework Towards Exhaustive System-Level Impact Evaluation 
Sub Title (in English)  
Keyword(1) Reliability  
Keyword(2) Fault Injection  
Keyword(3) Soft Errors  
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1st Author's Name Zhang Mingtao  
1st Author's Affiliation Kyoto University (Kyoto Uni.)
2nd Author's Name Cheng Quan  
2nd Author's Affiliation Kyoto University (Kyoto Uni.)
3rd Author's Name Hashimoto Masanori  
3rd Author's Affiliation Kyoto University (Kyoto Uni.)
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Speaker Author-1 
Date Time 2026-03-05 13:25:00 
Presentation Time 25 minutes 
Registration for VLD 
Paper # VLD2025-91, HWS2025-87, ICD2025-102 
Volume (vol) vol.125 
Number (no) no.382(VLD), no.383(HWS), no.384(ICD) 
Page pp.90-96 
#Pages 7 
Date of Issue 2026-02-25 (VLD, HWS, ICD) 

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