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Paper Abstract and Keywords
Presentation 2026-03-06 09:55
A Study on Multilevel Detection of Aging in Microcontrollers based on Side-Channel Information
Kakeru Hayakawa (Tohoku Univ.), Yuichi Hayashi (NAIST), Makoto Nagata (Kobe Univ.), Naofumi Homma (Tohoku Univ.) VLD2025-101 HWS2025-97 ICD2025-112
Abstract (in Japanese) (See Japanese page) 
(in English) This paper presents a method for detecting microcontroller aging using side-channel information. Specifically, we focus on the variations in the frequency spectrum of power consumption during operation caused by aging and propose a multi-level aging detection method based on a neural network model. The proposed method enables non-invasive and non-destructive detection after the microcontroller has been mounted on a printed circuit board (PCB) without requiring rigorous frequency identification; thus, it can effectively detect recycled or counterfeit ICs in the market. Experimental results using commercially available microcontrollers demonstrate that the proposed method can accurately classify multiple levels of aging with approximately 100 power traces.
Keyword (in Japanese) (See Japanese page) 
(in English) supply chain security / microcontroller / aging / side-channel analysis / / / /  
Reference Info. IEICE Tech. Rep., vol. 125, no. 383, HWS2025-97, pp. 141-146, March 2026.
Paper # HWS2025-97 
Date of Issue 2026-02-25 (VLD, HWS, ICD) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2025-101 HWS2025-97 ICD2025-112

Conference Information
Committee ICD HWS VLD  
Conference Date 2026-03-04 - 2026-03-07 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To HWS 
Conference Code 2026-03-ICD-HWS-VLD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Study on Multilevel Detection of Aging in Microcontrollers based on Side-Channel Information 
Sub Title (in English)  
Keyword(1) supply chain security  
Keyword(2) microcontroller  
Keyword(3) aging  
Keyword(4) side-channel analysis  
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1st Author's Name Kakeru Hayakawa  
1st Author's Affiliation Tohoku University (Tohoku Univ.)
2nd Author's Name Yuichi Hayashi  
2nd Author's Affiliation NARA Institute of Science and Technology (NAIST)
3rd Author's Name Makoto Nagata  
3rd Author's Affiliation Kobe University (Kobe Univ.)
4th Author's Name Naofumi Homma  
4th Author's Affiliation Tohoku University (Tohoku Univ.)
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Speaker Author-1 
Date Time 2026-03-06 09:55:00 
Presentation Time 25 minutes 
Registration for HWS 
Paper # VLD2025-101, HWS2025-97, ICD2025-112 
Volume (vol) vol.125 
Number (no) no.382(VLD), no.383(HWS), no.384(ICD) 
Page pp.141-146 
#Pages 6 
Date of Issue 2026-02-25 (VLD, HWS, ICD) 

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