Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2026-05-14 09:30
Study on Robust mmWave Beam Tracking with Bounded Updates against CAM Latency and Location Errors
Jin Nakazato, Yuki Sasaki, Mikio Hasegawa (TUS), Haruki Osaki, Tetsuya Iye (KKE), Kazuki Maruta (TUS) RCS2026-13
Abstract (in Japanese) (See Japanese page) 
(in English) Among millimeter-wave (mmWave) vehicle-to-vehicle (V2V) and vehicle-to-infrastructure (V2I) communications, this paper focuses specifically on V2I communications. While mmWave V2I communications can provide connected autonomous vehicles (CAVs) with high-capacity, low-latency wireless links, they are vulnerable to beam misalignment because they rely on highly directional beamforming. To address this challenge, a promising approach involves using V2X application-layer information, such as Cooperative Awareness Messages (CAMs), within the O-RAN Near-RT RIC control loop to assist with beam tracking. However, CAM inputs may become stale or incomplete due to transmission delays and positioning errors, potentially causing significant SNR degradation. Therefore, this paper proposes a robust mmWave beam tracking method that explicitly accounts for CAM delay and position error. In the proposed method, an update tolerance range is established around the beam direction based on the latest CAM, and the tracking angle derived from radio measurements is constrained within that range. This prevents control divergence while maintaining radio-driven correction capability. In a curved road scenario, we evaluated the method by systematically varying CAM delay, position error, and the update tolerance range, while comparing it with a representative baseline method. The results demonstrated that setting an appropriate update tolerance range improves SNR at the 5,% and 50,% CDF points, thereby enhancing robustness.
Keyword (in Japanese) (See Japanese page) 
(in English) Millimeter-wave / Beam Tracking / O-RAN / Near-RT RIC / xAPP / V2X / CAM / Robustness  
Reference Info. IEICE Tech. Rep., vol. 126, no. 23, RCS2026-13, pp. 1-6, May 2026.
Paper # RCS2026-13 
Date of Issue 2026-05-07 (RCS) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF RCS2026-13

Conference Information
Committee IN RCS NV  
Conference Date 2026-05-14 - 2026-05-15 
Place (in Japanese) (See Japanese page) 
Place (in English) Hiroshima City University Satellite Campus 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Ad-Hoc/Sensor Networks/MANET, Mobile Networks, M2M/IoT Communications, Wi-Fi, IEEE802.15(ZigBee) and others 
Paper Information
Registration To RCS 
Conference Code 2026-05-IN-RCS-NV 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Study on Robust mmWave Beam Tracking with Bounded Updates against CAM Latency and Location Errors 
Sub Title (in English)  
Keyword(1) Millimeter-wave  
Keyword(2) Beam Tracking  
Keyword(3) O-RAN  
Keyword(4) Near-RT RIC  
Keyword(5) xAPP  
Keyword(6) V2X  
Keyword(7) CAM  
Keyword(8) Robustness  
1st Author's Name Jin Nakazato  
1st Author's Affiliation Tokyo University of Science (TUS)
2nd Author's Name Yuki Sasaki  
2nd Author's Affiliation Tokyo University of Science (TUS)
3rd Author's Name Mikio Hasegawa  
3rd Author's Affiliation Tokyo University of Science (TUS)
4th Author's Name Haruki Osaki  
4th Author's Affiliation KOZO KEIKAKU ENGINEERING Inc. (KKE)
5th Author's Name Tetsuya Iye  
5th Author's Affiliation KOZO KEIKAKU ENGINEERING Inc. (KKE)
6th Author's Name Kazuki Maruta  
6th Author's Affiliation Tokyo University of Science (TUS)
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2026-05-14 09:30:00 
Presentation Time 25 minutes 
Registration for RCS 
Paper # RCS2026-13 
Volume (vol) vol.126 
Number (no) no.23 
Page pp.1-6 
#Pages 6 
Date of Issue 2026-05-07 (RCS) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan