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Paper Abstract and Keywords
Presentation 2026-06-02 10:55
A Don't Care Filling Algorithm to Improve Estimated Field Random Testability Using Multiple Functional Time Expansion Models
Kazuki Nakamoto, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyoto Sangyo Univ) CPSY2026-8 DC2026-8 RECONF2026-8
Abstract (in Japanese) (See Japanese page) 
(in English) Field testing is required for VLSIs on mission-critical systems to detect defects due to aging. Non-scan-based built-in self-test methods have been proposed to comprehensively test circuits in short periods of time such as when the power is turned on and off. As a testability measure for data paths at register transfer level, estimated field random testability (EFRT), which is calculated based on the status signal sequence given to the controller and the circuit structures of the data paths, was proposed. However, when control signal sequences supplied from controllers to data-paths contain don't-cares (X), the EFRT varies depending on the X assignment. An X filling method for control signal sequences has been proposed that uses a functional time expansion model in reverse order from the final time step after structural symbolic simulation is performed for a given status signal sequence length; however, EFRT still remains insufficient. In this paper, we propose an X filling algorithm for control signal sequences using multiple functional time expansion models for data-paths to improve EFRT.
Keyword (in Japanese) (See Japanese page) 
(in English) field testing / build-in self-test / pessimistic /optimistic structural symbol simulation / status signal sequences / control sequences / estimated field random testability / /  
Reference Info. IEICE Tech. Rep., vol. 126, no. 50, DC2026-8, pp. 38-43, June 2026.
Paper # DC2026-8 
Date of Issue 2026-05-25 (CPSY, DC, RECONF) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF CPSY2026-8 DC2026-8 RECONF2026-8

Conference Information
Committee CPSY DC RECONF IPSJ-ARC  
Conference Date 2026-06-01 - 2026-06-03 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To DC 
Conference Code 2026-06-CPSY-DC-RECONF-ARC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Don't Care Filling Algorithm to Improve Estimated Field Random Testability Using Multiple Functional Time Expansion Models 
Sub Title (in English)  
Keyword(1) field testing  
Keyword(2) build-in self-test  
Keyword(3) pessimistic /optimistic structural symbol simulation  
Keyword(4) status signal sequences  
Keyword(5) control sequences  
Keyword(6) estimated field random testability  
Keyword(7)  
Keyword(8)  
1st Author's Name Kazuki Nakamoto  
1st Author's Affiliation Nihon University (Nihon Univ)
2nd Author's Name Toshinori Hosokawa  
2nd Author's Affiliation Nihon University (Nihon Univ)
3rd Author's Name Masayoshi Yoshimura  
3rd Author's Affiliation Kyoto Sangyo Uniiversity (Kyoto Sangyo Univ)
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Speaker Author-1 
Date Time 2026-06-02 10:55:00 
Presentation Time 20 minutes 
Registration for DC 
Paper # CPSY2026-8, DC2026-8, RECONF2026-8 
Volume (vol) vol.126 
Number (no) no.49(CPSY), no.50(DC), no.51(RECONF) 
Page pp.38-43 
#Pages 6 
Date of Issue 2026-05-25 (CPSY, DC, RECONF) 

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