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Paper Abstract and Keywords
Presentation 2026-08-27 13:30
Analysis of Surface Morphology Before and After Contact in Electrical Contact Pairs with Different Surface Roughness
Yudai Suzuki, Junya Sekikawa (Shizuoka Univ.) R2026-19 EMD2026-10 CPM2026-22 OPE2026-52 LQE2026-11
Abstract (in Japanese) (See Japanese page) 
(in English) Surface profiles before and after contact were observed using a laser microscope after a flat and a spherical contact were brought into contact under a load of 8 N. The diameter of the cylindrical contact pair is 5 mm, and their end faces were used as the contact surfaces. The surface roughness of the flat silver contact was varied, while the buff-polished spherical contact, made of either silver or tungsten, was kept at a constant roughness. The flat contact was polished using buff polishing and #3000, #2000, #1000, #600, and #240 abrasive papers. When the spherical contact was silver, circular indentations were formed on the flat contact polished with buff, #3000, and #2000. In contrast, material transfer was observed on the spherical contact under all polishing conditions except buff, and its height increased from 1.01 to 2.45 µm with increasing maximum surface height (Rz) of the flat contact. When the spherical contact was tungsten, contact marks were observed on the flat contact under all polishing conditions except #240, whereas no material transfer or deformation was observed on the spherical contact.
Keyword (in Japanese) (See Japanese page) 
(in English) Electrical contact / Surface roughness / Contact surface / / / / /  
Reference Info. IEICE Tech. Rep., vol. 126, no. 152, EMD2026-10, pp. 7-12, Aug. 2026.
Paper # EMD2026-10 
Date of Issue 2026-08-20 (R, EMD, CPM, OPE, LQE) 
ISSN Online edition: ISSN 2432-6380
Copyright
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reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2026-19 EMD2026-10 CPM2026-22 OPE2026-52 LQE2026-11

Conference Information
Committee EMD R LQE OPE CPM  
Conference Date 2026-08-27 - 2026-08-28 
Place (in Japanese) (See Japanese page) 
Place (in English) Muroran Institute of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Photodetectors, Modulators, Optical Electrical device packaging and reliability 
Paper Information
Registration To EMD 
Conference Code 2026-08-EMD-R-LQE-OPE-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Analysis of Surface Morphology Before and After Contact in Electrical Contact Pairs with Different Surface Roughness 
Sub Title (in English)  
Keyword(1) Electrical contact  
Keyword(2) Surface roughness  
Keyword(3) Contact surface  
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1st Author's Name Yudai Suzuki  
1st Author's Affiliation Shizuoka University (Shizuoka Univ.)
2nd Author's Name Junya Sekikawa  
2nd Author's Affiliation Shizuoka University (Shizuoka Univ.)
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Speaker Author-1 
Date Time 2026-08-27 13:30:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # R2026-19, EMD2026-10, CPM2026-22, OPE2026-52, LQE2026-11 
Volume (vol) vol.126 
Number (no) no.151(R), no.152(EMD), no.153(CPM), no.154(OPE), no.155(LQE) 
Page pp.7-12 
#Pages 6 
Date of Issue 2026-08-20 (R, EMD, CPM, OPE, LQE) 

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