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Paper Abstract and Keywords
Presentation 2026-09-10 14:10
Comparative Evaluation of TRL and SOLT Calibrations for On-Wafer Millimeter-Wave Measurements and the Effects of Substrate Materials
Junichi Hayasaka (Denjiken), Makoto Yoshida (CDEX) MW2026-71
Abstract (in Japanese) (See Japanese page) 
(in English) The effects of substrate materials, transmission-line structures, and TRL/SOLT calibration methods on millimeter-wave on-wafer measurements are investigated. TRL calibration standards were designed and fabricated on alumina, quartz, and aluminum nitride substrates, and uniform transmission lines, stepped-impedance lines, and low-pass filters were evaluated. Quartz exhibited the lowest insertion loss of −0.004 dB at 44 GHz and the smoothest frequency response, whereas aluminum nitride showed noticeable phase and group-delay fluctuations above 30 GHz. The maximum difference in the 3-dB cutoff frequency between TRL and SOLT calibrations was 0.11 GHz (0.5%). These results clarify the respective effects of substrate materials, transmission-line structures, and calibration methods, providing useful guidelines for the design of TRL calibration standards and the selection of substrate materials and transmission-line structures for millimeter-wave on-wafer measurements.
Keyword (in Japanese) (See Japanese page) 
(in English) TRL Calibration / On-Wafer Measurement / Millimeter-Wave Measurement / Alumina Substrate / Quartz Substrate / Aluminum Nitride Substrate / RF Filter /  
Reference Info. IEICE Tech. Rep., vol. 126, no. 173, MW2026-71, pp. 18-23, Sept. 2026.
Paper # MW2026-71 
Date of Issue 2026-09-03 (MW) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF MW2026-71

Conference Information
Committee MW AP  
Conference Date 2026-09-09 - 2026-09-11 
Place (in Japanese) (See Japanese page) 
Place (in English) Ishikawa Prefectural Library 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Microwave, Millimeter wave, Radio propagation, Antennas and Propagation 
Paper Information
Registration To MW 
Conference Code 2026-09-MW-AP 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Comparative Evaluation of TRL and SOLT Calibrations for On-Wafer Millimeter-Wave Measurements and the Effects of Substrate Materials 
Sub Title (in English)  
Keyword(1) TRL Calibration  
Keyword(2) On-Wafer Measurement  
Keyword(3) Millimeter-Wave Measurement  
Keyword(4) Alumina Substrate  
Keyword(5) Quartz Substrate  
Keyword(6) Aluminum Nitride Substrate  
Keyword(7) RF Filter  
Keyword(8)  
1st Author's Name Junichi Hayasaka  
1st Author's Affiliation Research Institute for Electromagnetic Materials (Denjiken)
2nd Author's Name Makoto Yoshida  
2nd Author's Affiliation CDEX, Co., Ltd. (CDEX)
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Speaker Author-1 
Date Time 2026-09-10 14:10:00 
Presentation Time 20 minutes 
Registration for MW 
Paper # MW2026-71 
Volume (vol) vol.126 
Number (no) no.173 
Page pp.18-23 
#Pages 6 
Date of Issue 2026-09-03 (MW) 

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