IEICE Technical Committee Submission System
Conference Schedule		 Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

Technical Committee on Reliability (R)  (Searched in: 2014)

Search Results: Keywords 'from:2014-12-19 to:2014-12-19'
[Go to Official R Homepage (Japanese)] 
Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Ascending)
 Results 1 - 6 of 6  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
R 2014-12-19
13:15		 Tokyo   A study on the derivation of connected-(r, s)-out-of-(m, n):F system reliability
Taishin Nakamura, Xiao Xiao (TMU), Tomoaki Akiba (CIT), Hisashi Yamamoto (TMU) R2014-65		  [more] R2014-65
pp.1-6
R 2014-12-19
13:40		 Tokyo   A Note on Optimal Schedule for Applying Security Patches
Chao Luo, Hiroyuki Okamura, Tadashi Dohi (Hiroshima Univ.) R2014-66		  [more] R2014-66
pp.7-11
R 2014-12-19
14:05		 Tokyo   Availability Measure of One-shot Systems with Minimal Repair
Tomohiro Kitagawa, Tetsushi Yuge, Shigeru Yanagi (NDA) R2014-67		 One-shot system is a kind of systems that can be used only once during its life, whose failures are detected only throug... [more] R2014-67
pp.13-18
R 2014-12-19
14:35		 Tokyo   A consideration of the network reliability model for disaster risk reduction
Hitoshi Watanabe, Pingguo Huang (Tokyo Univ. of Science) R2014-68		 The possibility of the method to determine the reliability requirement of telecommunication network in disaster conditio... [more] R2014-68
pp.19-24
R 2014-12-19
15:00		 Tokyo   Aims and Key Issues of the Revision of JIS Z 8115 Dependability (Reliability) Terms -Part 2-
Ko Kawashima (ORIENTAL MOTOR), Akihiko Masuda (Tokyo Univ. of Science), Tateki Nishi (DNV GL Business Assurance Japan), Hiroyuki Goto (FDK) R2014-69		 The revision of JIS Z 8115:2000 Glossary of Used in Dependability is proceeded. In this revision, some terms
and defini... [more]		 R2014-69
pp.25-28
R 2014-12-19
15:25		 Tokyo   Trend on standardization of dependability -- Outline of IEC TC56 and agenda on international meeting --
Hiroyuki Goto (FDK), Yoshinobu Sato (JACO), Yoshiki Kinoshita, Makoto Takeyama (KU) R2014-70		 IEC/TC56 (International Electrotechnical Commission/Technical Committee 56) plenary meeting was held in Prague, Czech Re... [more] R2014-70
pp.29-34
 Results 1 - 6 of 6  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan