|
|
| Chair |
|
Takashi Aikyo (STARC) |
| Vice Chair |
|
Tomohiro Yoneda (NII) |
| Secretary |
|
Masato Kitagami (Chiba Univ.), Michinobu Nakao (Renesas) |
|
| Conference Date |
Fri, Jun 20, 2008 13:00 - 17:05 |
| Topics |
Design, Test, Verification |
| Conference Place |
|
Copyright
and
reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Fri, Jun 20 PM
13:00 - 14:50 |
| (1) |
13:00-13:25 |
P2P Online Game Using Coterie  DC2008-11 |
Shuta Asano, Hiromi Kobayashi (Tokai Univ.) |
| (2) |
13:25-13:50 |
Online Game Protocol for P2P Using Byzantine Agreement DC2008-12 |
Daisuke Wada, Hiromi Kobayashi (Tokai Univ.) |
| (3) |
13:50-14:15 |
A Design of Highly Dependable Processor with the Tolerance to Multiple Simultaneous Transient Faults DC2008-13 |
Makoto Kimura, Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki (Tokyo Metroplitan Univ.) |
| (4) |
14:15-14:40 |
Test generation for multi-operand adders consisting of full adders DC2008-14 |
Nobutaka Kito, Naofumi Takagi (Nagoya Univ.) |
| |
14:40-14:50 |
Break ( 10 min. ) |
Fri, Jun 20 PM
14:50 - 15:50 |
| (5) |
14:50-15:40 |
[Invited Talk]
The State of the Art and Future Trends of Test Design DC2008-15 |
Yasuo Sato (Hitachi) |
| |
15:40-15:50 |
Break ( 10 min. ) |
Fri, Jun 20 PM
15:50 - 17:05 |
| (6) |
15:50-16:15 |
Improving the Diagnostic Quality of Open Faults DC2008-16 |
Koji Yamazaki, Toshiyuki Tsutsumi (Meiji Univ.), Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo (Ehime Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.), Yuzo Takamatsu (Ehime Univ.) |
| (7) |
16:15-16:40 |
Transistor Aging and Operational Environment of Logic Circuits DC2008-17 |
Masafumi Haraguchi (Kyushu Inst. of Tech.), Yukiya Miura (Tokyo Metropolitan Univ.), Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen (Kyushu Inst. of Tech.) |
| (8) |
16:40-17:05 |
Note on Hardware Overhead and Fault Location for Memory BIST DC2008-18 |
Masayuki Arai, Kentaro Osawa, Kazuhiko Iwasaki (Tokyo Metro. Univ.), Michinobu Nakao (Renesas) |
| Announcement for Speakers |
| General Talk | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
| Invited Talk | Each speech will have 45 minutes for presentation and 5 minutes for discussion. |
| Contact Address and Latest Schedule Information |
| DC |
Technical Committee on Dependable Computing (DC) [Latest Schedule]
|
| Contact Address |
Michinobu Nakao (Renesas Technology Corp.)
Tel:042-312-5859 FAX:042-327-8619
E- :  o    bu    s |
Last modified: 2008-04-23 13:10:29
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