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Technical Committee on Dependable Computing (DC)  (Searched in: 2012)

Search Results: Keywords 'from:2012-12-14 to:2012-12-14'

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Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Ascending)
 Results 1 - 7 of 7  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2012-12-14
13:45
Fukui Aossa (Fukui) Mobile device prediction for location-based cloud service
Haibo Yan, Masato Kitakami (Chiba Univ.) DC2012-73
Mobility prediction is one of the most essential issues which need to be explored for management in a location-based clo... [more] DC2012-73
pp.1-4
DC 2012-12-14
14:15
Fukui Aossa (Fukui) Error Control for Loss-less Compressed Data by Using Inverted Index
Kohei Toyama, Masato Kitakami (Chiba Univ.) DC2012-74
Since large amount data are processed by recent computer systems, data compression is widely applied. Techniques of inde... [more] DC2012-74
pp.5-9
DC 2012-12-14
14:45
Fukui Aossa (Fukui) Fault Tolerance of an In-vehicle LAN by CAN Protocol under Severe Electro-magnetic Noise
Masahiko Negishi, Aromhack Saysanasongkham, Masayuki Arai, Mamoru Ohara, Satoshi Fukumoto (Tokyo Metropolitan Univ.) DC2012-75
This paper examines the fault tolerance of an in-vehicle LAN under high electromagnetic environment.
First, we present ... [more]
DC2012-75
pp.11-15
DC 2012-12-14
15:15
Fukui Aossa (Fukui) Development of Distributed Control System Using Flexible System Reconfiguration
Hiroshi Mochizuki, Yuta Takeda, Yujiro Tohyama (Nihon Univ.) DC2012-76
At present, a distributed control system that realizes more advanced work in real time is noted.
And there are many res... [more]
DC2012-76
pp.17-20
DC 2012-12-14
16:00
Fukui Aossa (Fukui) A Test Generation Model for Over-testing Alleviation and Its Application to Testing Based on Fault Acceptability
Masaaki Sakurada, Hideyuki Ichihara, Tsuyoshi Iwagaki, Tomoo Inoue (HCU) DC2012-77
Over-testing, which is to judge fault-free chips as faulty ones, is a cause of the decrease in the effective yield of ch... [more] DC2012-77
pp.21-26
DC 2012-12-14
16:30
Fukui Aossa (Fukui) Research on Formalization and Analysis of Automatic Train Protection and Block System
Guo Xie, Hiroshi Mochizuki, Sei Takahashi, Hideo Nakamura (Nihon Univ.) DC2012-78
 [more] DC2012-78
pp.27-30
DC 2012-12-14
17:00
Fukui Aossa (Fukui) Verification of Automatic Block System for Single Line Using SMT Solver
Natsuki Terada (RTRI) DC2012-79
Formal methods are expected to increase reliability of software, including that of signaling systems. We modeled the sp... [more] DC2012-79
pp.31-36
 Results 1 - 7 of 7  /   
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