|
Chair |
|
Ryo Nagase (NTT) |
Vice Chair |
|
Kiyoshi Yoshida (Nippon Inst. of Tech.) |
Secretary |
|
Makoto Hasegawa (Chitose Inst. of Science and Tech.), Junya Sekikawa (Shizuoka Univ.) |
Assistant |
|
Mitsuo Ichiya (Matsushita) |
|
Conference Date |
Fri, Jan 23, 2009 13:30 - 17:05 |
Topics |
|
Conference Place |
|
Contact Person |
045(864)8611 (会場) |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Fri, Jan 23 PM 13:30 - 17:05 |
|
13:30-13:35 |
Opening Address ( 5 min. ) |
(1) |
13:35-14:15 |
[Invited Talk]
High Density Optical Interconnection Technologies for Large Capacity Infomation Processing Equipments EMD2008-113 |
Yasunobu Matsuoka, Takuma Ban, Reiko Mita, Toshiki Sugawara (Hitachi Ltd.,) |
(2) |
14:15-14:40 |
High Density Multi-Fiber Connector for Optical Interconnection EMD2008-114 |
Naoya Nishimura, Katsuki Suematsu, Masao Shinoda, Masato Shiino (The Furukawa Electric Co. Ltd.,) |
(3) |
14:40-15:05 |
16-fiber Type SF connector for on-board optical wiring EMD2008-115 |
Ryo Nagase, Shuichiro Asakawa (NTT), Masaru Kobayashi (NTT-AT), Yoshiteru Abe (NTT) |
|
15:05-15:20 |
Break ( 15 min. ) |
(4) |
15:20-15:45 |
Degradation phenomenon of electrical contacts by hammering oscillating mechanism
-- for Contact Resistance (III) -- EMD2008-116 |
Shin-ichi Wada, Taketo Sonoda, Keiji Koshida, Mitsuo Kikuchi, Hiroaki Kubota (TMC System Co., Ltd.,), Koichiro Sawa (Keio Univ.) |
(5) |
15:45-16:10 |
Synthesis of electroconductive diamond film for application as electrical contact EMD2008-117 |
Toshiki Tsubota, Tomoo Hamayama, Naoya Murakami, Teruhisa Ohno (Kyushu Inst. of Tech.), Tomoko Suenaga (Kumamoto Ind Res Inst.), Hiroyuki Nagahata (Sanyu Switch Co., Ltd.) |
(6) |
16:10-16:35 |
A Study of Solder Connection Reliability in Cooling Design for Outdoor Telecommunications Equipment EMD2008-118 |
Nobuhiro Tamayama, Shinya Hamagishi, Seiji Asai, Takeshi Tajiri, Osamu Kamimura (Hitachi Com Tech, Ltd.) |
(7) |
16:35-17:00 |
Manufacturing Technology for Embedded LSI(WLP) Substrates EMD2008-119 |
Keisuke Okada (NEC Toppan Circuit Solutions. INC.) |
|
17:00-17:05 |
Closing Address ( 5 min. ) |
Contact Address and Latest Schedule Information |
EMD |
Technical Committee on Electromechanical Devices (EMD) [Latest Schedule]
|
Contact Address |
Makoto Hasegawa(Chitose Inst. of Science and Technorogy)
TEL (0123)27-6059、FAX (0123)27-6059
E-: pn
Junya Sekikawa (Shizuoka Univ.)
TEL (053) 478-1618、FAX (053) 478-1618
E-: tjkipc
Mituo Ichiya(Matsushita Electric Works)
TEL (070)5432-0873、FAX (03)6218-1921
E-: iw |
Announcement |
Latest information will be presented on the homepage: http://www.ieice.org/es/emd/jpn/ |
Last modified: 2009-09-07 15:55:57
|