|
|
| Chair |
|
Yasushi Kadota (Ricoh) |
| Vice Chair |
|
Hiroyuki Okamura (Hiroshima Univ.) |
| Secretary |
|
Takenori Sakumura (Hosei Univ.), Shinji Inoue (Kansai Univ.) |
| Assistant |
|
Shinji Yokogawa (Univ. of Electro-Comm.), Takahide Yoshikawa (Fujitsu Lab.), Shuhei Ota (Kanagawa Univ.) |
|
| Conference Date |
Sat, Nov 30, 2024 12:30 - 16:35 |
| Topics |
Reliability of semiconductor and electronic devices, Reliability general |
| Conference Place |
|
| Sponsors |
This conference is co-sponsored by Reliability Engineering Association of Japan, IEEE Reliability Society Japan Chapter.
|
| Registration Fee |
This workshop will be held as the IEICE workshop in fully electronic publishing. Registration fee will be necessary except the speakers and participants other than the participants to workshop(s) in non-electronic publishing. See the registration fee page. We request the registration fee or presentation fee to participants who will attend the workshop(s) on R. |
| Due for Registration |
Please proceed the payment of registration fee by 3 days before the workshop date. |
| Announcement for Speakers |
| General Talk | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
| Contact Address and Latest Schedule Information |
| R |
Technical Committee on Reliability (R) [Latest Schedule]
|
| Contact Address |
Shinji Inoue (Kansai Univ.)
E- : i   n i-u |
Last modified: 2024-09-11 16:56:17
|