IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

Technical Committee on Dependable Computing (DC)  (Searched in: 2009)

Search Results: Keywords 'from:2009-04-21 to:2009-04-21'

[Go to Official DC Homepage (Japanese)] 
Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Ascending)
 Results 1 - 9 of 9  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
DC, CPSY 2009-04-21
11:00
Tokyo Akihabara Satellite Campus, Tokyo Metropolitan Univ. Highly Reliable Sequential Circuits Considering Multiple Simultaneous Transient Faults
Hideo Kohinata, Kohei Marumoto, Masayuki Arai, Satoshi Fukumoto (Tokyo Metropolitan Univ.) CPSY2009-1 DC2009-1
This paper proposes a novel technique to improve the reliability of sequential circuits. The proposed technique adopts t... [more] CPSY2009-1 DC2009-1
pp.1-6
DC, CPSY 2009-04-21
11:25
Tokyo Akihabara Satellite Campus, Tokyo Metropolitan Univ. A Development Process with A Model Checking Criterion
Michitaka Inui (Mitsubishi Electric Micro-Computer Application Software Corp.), Nobukazu Yoshioka (NII) CPSY2009-2 DC2009-2
We have proposed a process for solving problems that we have to apply the model checking in a company. Also we have prop... [more] CPSY2009-2 DC2009-2
pp.7-12
DC, CPSY 2009-04-21
13:00
Tokyo Akihabara Satellite Campus, Tokyo Metropolitan Univ. Evaluation of a Metropolis Algorithm for Constructing Unstructured Overlay Networks
Tatsushi Takamura, Tatsuhiro Tsuchiya, Tohru Kikuno (Osaka Univ.) CPSY2009-3 DC2009-3
Peer-to-peer(P2P) systems use a virtual network called an overlay network to route messages to distinations.
Some algor... [more]
CPSY2009-3 DC2009-3
pp.13-17
DC, CPSY 2009-04-21
13:25
Tokyo Akihabara Satellite Campus, Tokyo Metropolitan Univ. A Security Data-Flow Analysis in the Secure Software Development Environment DFITS
Fukutomo Nakanishi, Ryotaro Hayashi, Hiroyoshi Haruki, Yurie Fujimatsu, Mikio Hashimoto (Toshiba Corp.) CPSY2009-4 DC2009-4
We proposed a development environment DFITS, which helps security programmers to create software against tampering in-me... [more] CPSY2009-4 DC2009-4
pp.19-24
DC, CPSY 2009-04-21
13:50
Tokyo Akihabara Satellite Campus, Tokyo Metropolitan Univ. Fast Soft Error Rate Estimation for Circuits Containing Arithmetic Units
Motoharu Hirata, Masayoshi Yoshimura, Yusuke Matsunaga, Hiroto Yasuura (Kyushu Univ.) CPSY2009-5 DC2009-5
This paper describes soft errors which are errors in LSI that are due to external radiation.The soft error rate (SER) wh... [more] CPSY2009-5 DC2009-5
pp.25-30
DC, CPSY 2009-04-21
14:30
Tokyo Akihabara Satellite Campus, Tokyo Metropolitan Univ. [Invited Talk] Evolution and threat of botnet
Toshiaki Sudou (NTT Communications) CPSY2009-6 DC2009-6
The damage of a variety of security problems such as Information leakage ,DDoS, and spam from terminal that hooks up to ... [more] CPSY2009-6 DC2009-6
pp.31-35
DC, CPSY 2009-04-21
15:45
Tokyo Akihabara Satellite Campus, Tokyo Metropolitan Univ. A design of testable response analyzers in built-in self-test
Yuki Fukazawa, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) CPSY2009-7 DC2009-7
In the BIST(Built-in self-test) scheme, the occurrence of faults in BIST circuits, e.g., test generators and response co... [more] CPSY2009-7 DC2009-7
pp.37-42
DC, CPSY 2009-04-21
16:10
Tokyo Akihabara Satellite Campus, Tokyo Metropolitan Univ. Pulse Generation Analysis for SER Estimation Targeted to Cell-based Design.
Daisuke Kozuwa, Masayoshi Yoshimura, Yusuke Matsunaga (Kyusyu Univ.) CPSY2009-8 DC2009-8
The charge deposition that results from a neutron strikes to a transistor alter the memory state or the logic state of o... [more] CPSY2009-8 DC2009-8
pp.43-48
DC, CPSY 2009-04-21
16:35
Tokyo Akihabara Satellite Campus, Tokyo Metropolitan Univ. Pulse Propagation Analysis for SER Evaluation of Logic Circuits
Shoji Harada, Yusuke Akamine, Masayoshi Yoshimura, Yusuke Matsunaga (Kyushu Univ) CPSY2009-9 DC2009-9
As a transistor feature size scales down in recent years, soft error tends to increase. In logic circuits, a pulse genar... [more] CPSY2009-9 DC2009-9
pp.49-54
 Results 1 - 9 of 9  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan