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Technical Committee on Electron Devices (ED) (Searched in: 2006)
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Search Results: Keywords 'from:2006-11-24 to:2006-11-24'
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| [Go to Official ED Homepage (Japanese)] |
| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Ascending) |
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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| ED, SDM, R |
2006-11-24
13:00 |
Osaka |
Central Electric Club |
[Invited Talk]
Fault diagnosis technology based on transistor behavor analysis
Masaru Sanada (KUT) |
[more] |
R2006-31 ED2006-176 SDM2006-194
pp.1-6 |
| ED, SDM, R |
2006-11-24
13:45 |
Osaka |
Central Electric Club |
*
Shunsuke Kunimatsu, Akifumi Imai (Kyoto Univ.), Kensuke Akiyama (Kanagawa Industrial Technology Center), Yoshihito Maeda (Kyoto Univ.) |
[more] |
R2006-32 ED2006-177 SDM2006-195
pp.7-10 |
| ED, SDM, R |
2006-11-24
14:10 |
Osaka |
Central Electric Club |
Takafumi Jonishi, Yuichiro Ando, Yoshihito Maeda (Kyoto Univ.) |
[more] |
R2006-33 ED2006-178 SDM2006-196
pp.11-14 |
| ED, SDM, R |
2006-11-24
14:35 |
Osaka |
Central Electric Club |
Hot-carrier reliability in Trench Lateral Power MOSFETs
Mutsumi Sawada, Shinichiro Matsunaga (Fuji Electric AT), Masaharu Yamaji, Akio Kitamura (Fuji Electric DT), Naoto Fujishima (Fuji Electric AT) |
[more] |
R2006-34 ED2006-179 SDM2006-197
pp.15-20 |
| ED, SDM, R |
2006-11-24
15:15 |
Osaka |
Central Electric Club |
Effects of heterointerface flatness on device performance of InP-based HEMT
-- Reduction of interface roughness scattering using (411)A-oriented substrate --
Issei Watanabe (NICT), Keisuke Shinohara (Rockwell), Takahiro Kitada (Univ.of Tokushima), Satoshi Shimomura (Ehimeiv.), Akira Endoh, Yoshimi Yamashita, Takashi Mimura (Fujitsu Labs.), Satoshi Hiyamizu (Osaka Univ./Nara National College of Tech.), Toshiaki Matsui (NICT) |
[more] |
R2006-35 ED2006-180 SDM2006-198
pp.21-25 |
| ED, SDM, R |
2006-11-24
15:40 |
Osaka |
Central Electric Club |
Surface passivation film dependence of 1/f noise characteristic in AlGaN/GaN HEMT
Takanori Matsushima, Masahiro Nakajima, Kazuki Nomoto, Masataka Satoh, Tohru Nakamura (Hosei Univ.) |
[more] |
R2006-36 ED2006-181 SDM2006-199
pp.27-31 |
| ED, SDM, R |
2006-11-24
16:05 |
Osaka |
Central Electric Club |
Seiya Kasai, Alberto F. Basile, Tamotsu Hashizume (Hokkaido Univ.) |
[more] |
R2006-37 ED2006-182 SDM2006-200
pp.33-38 |
| ED, SDM, R |
2006-11-24
16:30 |
Osaka |
Central Electric Club |
Surface Passivation of AlGaN/GaN HFETs by a Sputtered AlN Thin Film
Hiroaki Ueno, Tomohiro Murata, Hidetoshi Ishida, Tetsuzo Ueda, Yasuhiro Uemoto, Tsuyoshi Tanaka, Kaoru Inoue (Panasonic) |
[more] |
R2006-38 ED2006-183 SDM2006-201
pp.39-42 |
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