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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM, ICD 2015-08-24
10:55		 Kumamoto Kumamoto City [Invited Talk] Implementation of TFET Spice Model for Ultra-Low Power Circuit Analysis
Chika Tanaka, Akira Hokazono, Kanna Adachi, Masakazu Goto, Yoshiyuki Kondo, Emiko Sugizaki, Motohiko Fujimatsu, Hiroyuki Hara, Shinji Miyano, Keiichi Kushida, Shigeru Kawanaka (Toshiba) SDM2015-59 ICD2015-28		  [more] SDM2015-59 ICD2015-28
pp.11-13
SDM, ICD 2011-08-25
10:25		 Toyama Toyama kenminkaikan Power-Performance Estimation of Datta-Das Spin Transistor
Yoshiyuki Kondo, Shigeru Kawanaka, Kanna Adachi (Toshiba) SDM2011-74 ICD2011-42		 We report the results of power-performance analysis
of Datta-Das spin transistor(SFET) in this paper.
We clarified it... [more]		 SDM2011-74 ICD2011-42
pp.17-22
SDM, ICD 2011-08-25
10:50		 Toyama Toyama kenminkaikan Plasma Doping and Laser Spike Annealing Technique for Steep SDE Formation in nano-scale MOSFET
Emiko Sugizaki, Toshitaka Miyata, Yasunori Oshima, Akira Hokazono, Kanna Adachi, Kiyotaka Miyano, Hideji Tsujii, Shigeru Kawanaka, Satoshi Inaba, Takaharu Itani, Toshihiko Iinuma, Yoshiaki Toyoshima (Toshiba) SDM2011-75 ICD2011-43		 The importance of impurity profile design for Source/Drain Extension (SDE) is widely recognized for deeply scaled MOSFET... [more] SDM2011-75 ICD2011-43
pp.23-27
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