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Committee Date Time Place Paper Title / Authors Abstract Paper #
RECONF 2015-06-20
14:00		 Kyoto Kyoto University On the Evaluation Board AISTino equipped with the Fourth Flex Power FPGA chip with SOTB transistors
Hanpei Koike, Masakazu Hioki, Yasuhiro Ogasahara (AIST), Hayato Ishigaki, Toshiyuki Tsutsumi (Meiji Univ.), Tadashi Nakagawa, Toshihiro Sekigawa (AIST) RECONF2015-22		 Flex Power FPGA utilizes threshold voltage programmability to reduce its static power by the body bias control of circui... [more] RECONF2015-22
pp.119-124
ICD, SDM 2014-08-05
09:50		 Hokkaido Hokkaido Univ., Multimedia Education Bldg. Statistical Analysis of Minimum Operation Voltage (Vmin) in Fully Depleted Silicon-on-Thin-BOX (SOTB) SRAM Cells
Tomoko Mizutani (Univ. of Tokyo), Yoshiki Yamamoto, Hideki Makiyama, Tomohiro Yamashita, Hidekazu Oda, Shiro Kamohara, Nobuyuki Sugii (LEAP), Toshiro Hiramoto (Univ. of Tokyo) SDM2014-72 ICD2014-41		 The minimum operation voltage (Vmin) of fully depleted (FD) silicon-on-thin-BOX (SOTB) SRAM cells are measured and stati... [more] SDM2014-72 ICD2014-41
pp.55-58
EMD 2013-12-20
16:05		 Tokyo Kikai-Shinko-Kaikan Bldg. Characteristics of Electric Contact Behavior in Boundary Arc Area -- ( II )Arc Incidence at Low Current Area --
Yoshiro Yoshida (ALPS Electric) EMD2013-135		 In order to clarify electrical threshold and its probability in occurrence, arc discharge in electrical boundary area wa... [more] EMD2013-135
pp.23-26
ICD, ITE-IST 2013-07-05
17:40		 Hokkaido San Refre Hakodate Failure mode analysis for flip-flops at low voltages
Takafumi Fujita, Junya Kawashima, Masayuki Hiromoto (Kyouto Univ.), Hiroshi Tsutsui (Hokkaido Univ.), Hiroyuki Ochi (Ritsumeikan Univ.), Takashi Sato (Kyouto Univ.) ICD2013-45		 Towards the reducing power consumption, subthreshold circuit which operates at a low voltage below the threshold voltage... [more] ICD2013-45
pp.129-134
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