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Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD, SDM 2014-08-04
11:15		 Hokkaido Hokkaido Univ., Multimedia Education Bldg. Testability Improvement for 12.8 GB/s Wide IO DRAM Controller with Small Area Prebonding TSV test and 1GHz Sampled Fully Digital Noise Monitor
Takao Nomura, Ryo Mori, Koji Takayanagi, Toshihiko Ochiai, Kazuki Fukuoka, Tsuyoshi Kida, Koji Nii, Sadayuki Morita (REL) SDM2014-65 ICD2014-34		 We developed a Wide IO DRAM controller chip with Through Silicon Via (TSV) technology. Test circuitry is embedded in the... [more] SDM2014-65 ICD2014-34
pp.17-21
SDM, ICD 2013-08-02
10:50		 Ishikawa Kanazawa University A 123uW Standby Power Technique with EM-Tolerant 1.8V I/O NMOS Power Switch in 28nm HKMG Technology
Kazuki Fukuoka, Ryo Mori, Akira Kato, Mitsuhiko Igarashi, Koji Shibutani, Takashi Yamaki, Koji Nii, Sadayuki Morita, Takao Koike (Renesas Electronics), Noriaki Sakamoto (Renesas Mobile) SDM2013-78 ICD2013-60		  [more] SDM2013-78 ICD2013-60
pp.65-69
ICD, SDM 2012-08-03
13:10		 Hokkaido Sapporo Center for Gender Equality, Sapporo, Hokkaido A Fast-Transient-Response Digital Low-Dropout Regulator Comprising Thin-Oxide MOS Transistors in 40-nm CMOS process
Masafumi Onouchi, Kazuo Otsuga, Yasuto Igarashi, Toyohito Ikeya, Sadayuki Morita (Renesas Electronics), Koichiro Ishibashi (Univ. of Electro-Comm.), Kazumasa Yanagisawa (Renesas Electronics) SDM2012-82 ICD2012-50		 A digital low-dropout (LDO) regulator comprising only thin-oxide MOS transistors was developed. The input voltage to the... [more] SDM2012-82 ICD2012-50
pp.105-110
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