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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
MW, ED |
2009-01-15 13:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg |
Influence of Gate Structure on Parasitic Gate Delay in InGaAs-Channel HEMTs Kohei Horiike, Syunsuke Fukuda, Keisuke Akagawa, Tetsuya Suemitsu, Taiichi Otsuji (Tohoku Univ.) ED2008-211 MW2008-176 |
InP-based high electron mobility transistors (HEMTs) have been developed for microwave and millimeter-wave ICs. By scali... [more] |
ED2008-211 MW2008-176 pp.77-81 |
ED |
2008-12-20 10:45 |
Miyagi |
Tohoku Univ. |
[Invited Talk]
Emission and detection using two dimensional plasma oscillations in nanometer transistors and their applications to terahertz imaging Abdelouahad El Fatimy, Tetsuya Suemitsu, Taiichi Otsuji (Tohoku Univ.), P. Mounaix, J. C. Delagnes (Univ. Bordeaux), Wojciech Knap, Nina Dyakonova (Univ. Montpellier2) ED2008-194 |
We present recent results on terahertz emission/detection utilizing two-dimensional plasmons in different types of InGaA... [more] |
ED2008-194 pp.47-52 |
ED |
2008-12-20 11:25 |
Miyagi |
Tohoku Univ. |
Effect of parasitic gate fringing capacitance on the terahertz plasma resonance in HEMT's Nobuhiro Magome, Takuya Nishimura (Tohoku Univ.), Irina Khmyrova (Univ. of Aizu), Tetsuya Suemitsu (Tohoku Univ.), Wojtek Knap (Univ. Montpellier2), Taiichi Otsuji (Tohoku Univ.) ED2008-195 |
Influence of fringing electric field due to nonideality of the gate-two-dimensional electron gas (2DEG) channel capacita... [more] |
ED2008-195 pp.53-58 |
ED |
2007-11-27 17:20 |
Miyagi |
Tohoku Univ. Research Institute of Electrical Communication |
Emission of terahertz electromagnetic radiation from a 2-dimensional plasmon-resonant emitter of a HEMT structure Hiroyuki Handa, Yohei Hosono, Hiroki Tsuda, Yahya Moubarak Meziani, Tetsuya Suemitsu, Taiichi Otsuji (Tohoku Univ.) ED2007-195 |
We have fabricated the 2D plasmon resonant emitter which contains double grating gate structure and estimated its emissi... [more] |
ED2007-195 pp.45-50 |
ED, MW |
2006-01-19 14:45 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
0.15-mm-dual-gate AlGaN/GaN HEMT mixers Kenji Shiojima, Takashi Makimura, Toshihiko Kosugi, Tetsuya Suemitsu, Naoteru Shigekawa, Masanobu Hiroki, Haruki Yokoyama (NTT) |
[more] |
ED2005-206 MW2005-160 pp.41-44 |
LQE, ED, CPM |
2005-10-13 13:50 |
Shiga |
Ritsumeikan Univ. |
Effect of epitaxial layer crystal quality on DC and RF characteristics of AlGaN/GaN short-gate HEMTs Kenji Shiojima, Takashi Makimura, Tetsuya Suemitsu, Naoteru Shigekawa, Masanobu Hiroki, Haruki Yokoyama (NTT) |
[more] |
ED2005-127 CPM2005-114 LQE2005-54 pp.43-46 |
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