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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 7 of 7  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
AI 2014-11-29
17:05		 Fukuoka   Information strategy and Data marketplace: discussion about meaning of sharing data as a position to provide it -- business case from traffic data marketplace in automotive society --
Jun Nakamura, Youichi Sakurai, Hiroshi Ogawa (Volvo), Masahiko Teramoto AI2014-34		 Discussion is made in view of data provider on data marketplace, in terms of organizational issue, capability to analyze... [more] AI2014-34
pp.51-56
MBE 2011-09-26
10:25		 Niigata Nagaoka Univ. of Tech. Human Pulse Detection Using Multiple Silicon Microphones toward Estimation of Physical Condition
Ryoma Hirota, Yasushi Hanasaka, Yuudai Katuta (NUT), Takashi Ishiguro (TAIYO YUDEN Co. Ltd), Hiroshi Ogawa (Bifröstec Inc.), Shusaku Nomura (NUT) MBE2011-40		  [more] MBE2011-40
pp.5-8
DC 2010-02-15
10:00		 Tokyo Kikai-Shinko-Kaikan Bldg. Study on a Test Generation Method for Transition Faults Using Multi Cycle Capture Test
Hiroshi Ogawa, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyusyu Univ.), Koji Yamazaki (Meiji Univ.) DC2009-67		 Overtesting induces unnecessary yield loss. Untestable faults have no effect on normal functions of circuits. However, i... [more] DC2009-67
pp.13-18
VLD, IPSJ-SLDM 2009-05-20
15:20		 Fukuoka Kitakyushu International Conference Center A scan test generation method to reduce the number of detected untestable faults
Hiroshi Ogawa (Nihon Univ.), Masayoshi Yoshimura (Kyushu Univ.), Toshinori Hosokawa (Nihon Univ.), Koji Yamazaki (Meiji Univ.) VLD2009-3		 There are faults which can be detected by only the invalid test patterns. This is one of the causes for the overtesting.... [more] VLD2009-3
pp.13-18
DC 2009-02-16
10:25		 Tokyo   A test pattern generation method to reduce the number of detected untestable faults on scan testing
Masayoshi Yoshimura (Kyusyu Univ.), Hiroshi Ogawa (Nihon Univ.), Yusyo Omori (Fujitsu Microelectronics), Toshinori Hosokawa (Nihon Univ.), Koji Yamazaki (Meizi Univ.) DC2008-69		 Scan testing is one of the most popular test method fo VLSIs. In this test, only information of the circuit structure is... [more] DC2008-69
pp.7-12
DC 2008-02-08
10:25		 Tokyo Kikai-Shinko-Kaikan Bldg. Test Generation Method for Full Scan Circuit Using Multi Cycle Capture Test
Yusho Omori, Hiroshi Ogawa, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyushu Univ.), Koji Yamazaki (Meiji Univ.) DC2007-70		 Currently, scan testing is one of the most popular test methods for VLSIs. In this testing, only information of the circ... [more] DC2007-70
pp.19-24
AP 2005-01-20
16:40		 Saga Saga University [Special Talk] Present status and research plan of Saga synchrotron light center
Hiroshi Ogawa (Saga Univ.) 		 [more]
 Results 1 - 7 of 7  /   
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