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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM, VLD |
2007-10-31 14:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
The Analysis of MOSFET Characteristic Fluctuation Caused by Layout Variation Kunio Anzai, Hitoshi Tsuno, Masao Matsumura, Satoe Minami, Yohei Hiura, Akira Takeo, Fu Wingsze, Yuzo Fukuzaki, Michihiro Kanno, Naoki Nagashima, Hisahiro Ansai (Sony) VLD2007-66 SDM2007-210 |
[more] |
VLD2007-66 SDM2007-210 pp.31-34 |
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