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Committee Date Time Place Paper Title / Authors Abstract Paper #
EMD 2011-11-17
17:30		 Akita Akita Univ. Tegata Campus A Robust Solution for Hesitate Phenomenon in Closing Process of Sealed Electromagnetic Relay
Jie Deng, Xuerong Ye, Yue Ma, Guofu Zhai (Harbin Inst. of Tech.) EMD2011-86		 To the Sealed Electromagnetic Relay (SEMR) of small batch and having difficulty in automatic production, so much manual ... [more] EMD2011-86
pp.103-108
EMD 2010-11-11
11:00		 Overseas Xi'an Jiaotong University Failure process and dynamic reliability estimation of sealed relay
Xuerong Ye, Jie Deng, Qiong Yu, Guofu Zhai (Harbin Inst. of Tech.) EMD2010-76		 Usually the failure rate of a sealed relay is regarded as a constant value, no matter where and how it is used. However,... [more] EMD2010-76
pp.41-44
EMD 2009-11-20
09:40		 Tokyo Nippon Institute of Technology, Kanda Campus, Tokyo, Japan Reliability Tolerance Design of Electromagnetic Relay Considering Paremeters Fluctuation
Xuerong Ye, Huimin Liang, Jie Deng, Guofu Zhai (Harbin Inst. of Tech.) EMD2009-90		 Electrical life of Electromagnetic relay (EMR) depends mainly on contacts. Besides material and appearance of contacts, ... [more] EMD2009-90
pp.93-96
EMD 2008-11-15
10:40		 Miyagi Tohoku Bunka Gakuin University (Sendai) Research on Dynamic Characteristics Testing and Analyzing System of Electromagnetic Relay
Xuerong Ye, Huimin Liang, Jie Deng, Guofu Zhai (Harbin Inst. Tech.) EMD2008-69		  [more] EMD2008-69
pp.17-20
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