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Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD 2013-04-11
17:30		 Ibaraki Advanced Industrial Science and Technology (AIST) [Panel Discussion] Future prospects of memory solutions for smart society -- Can new nonvolatile memories replace SRAM/DRAM/Flash? --
Koji Nii (Renesas Erctronics), Tetsuo Endoh (Tohoku Univ.), Yoshikazu Katoh (Panasonic), Satoru Hanzawa (Hitachi), Kazuhiko Kajigaya (Elpida Memory), Atsushi Kawasumi (Toshiba), Toru Miwa (SanDisk) ICD2013-11		 (To be available after the conference date) [more] ICD2013-11
p.53
ICD 2008-04-17
15:20		 Tokyo   [Panel Discussion] Probing into the Potential of the Future Flash -- An Impact of Flash Revolution --
Kazuhiko Kajigaya (Elpida), Naoharu Shinozaki (Spansion), Toshio Kakihara (HGST), Kazushige Kanda (Toshiba), Michio Kobayashi (Spansion), Makoto Saen (Hitachi), Tadahiko Sugibayashi (NEC), Ken Takeuchi (Tokyo Univ.), Hisao Tsukazawa (Toshiba) ICD2008-7		 Flash-memory is now the driving force for the semiconductor process technology and trying to expand its new market with ... [more] ICD2008-7
pp.37-38
ICD, SDM 2005-08-19
13:50		 Hokkaido HAKODATE KOKUSAI HOTEL A 0.4-V High-Speed Long-Retention-Time DRAM Array with 12 F2 Twin Cell
Riichiro Takemura, Kiyoo Itoh, Tomonori Sekiguchi, Satoru Akiyama, Satoru Hanzawa (Hitachi), Kazuhiko Kajigaya (ELPIDA), Takayuki Kawahara (Hitachi) 		We propose and evaluate a DRAM cell array with 12-F2 twin cell in terms of speed, retention time, and low-voltage operat... [more] SDM2005-152 ICD2005-91
pp.55-60
ICD 2005-04-14
14:30		 Fukuoka   [Invited Talk] Statistical Integration In Multigigabit DRAM Design
Tomonori Sekiguchi, Satoru Akiyama (Hitachi), Kazuhiko Kajigaya (Elpida), Satoru Hanzawa, Riichiro Takemura, Takayuki Kawahara (Hitachi) 		Concordant memory-array design incorporates device fluctuations statistically into signal-to-noise ratio analysis in DRA... [more] ICD2005-8
pp.37-42
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