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All Technical Committee Conferences (Searched in: All Years)
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| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| MRIS, ITE-MMS |
2018-07-06
16:35 |
Tokyo |
Waseda Univ. |
Ultra-high-efficient Writing in Voltage-Control Spintronics Memory(VoCSM)
Altansargai Buyandalai, Mariko Shimizu, Hiroaki Yoda, Tomoaki Inokuchi, Yuichi Ohsawa, Naoharu Shimomura, Satoshi Shirotori, Hideyurki Sugiyama, Yushi Kato, Mizue Ishikawa, Katsuhiko Koi, Soichi Oikawa, Kazutaka Ikegami, Satoshi Takaya, Shinobu Fujita, Atsushi Kurobe (Toshiba Corporation) |
[more] |
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| MRIS, ITE-MMS |
2017-07-07
16:10 |
Tokyo |
Tokyo Tech |
Voltage-Control Spintronics Memory (VoCSM)
Altansargai Buyandalai, Hiroaki Yoda, Mariko Shimizu, Tomoaki Inokuchi, Yuichi Ohsawa, Naoharu Shimomura, Satoshi Shirotori, Hideyurki Sugiyama, Yushi Kato, Yuuzo Kamiguchi, Katsuhiko Koi, Soichi Oikawa, Mizue Ishikawa, Yoshiaki Saito, Atsushi Kurobe (Toshiba Corp.)  MR2017-16 |
We propose a new spintronics-based memory VoCSM (Voltage-control Spintronics Memory) employing the voltage-control-magne... [more] |
MR2017-16
pp.37-40 |
| MRIS, ITE-MMS |
2016-07-08
16:10 |
Tokyo |
Chuo Univ. |
Non-Local Spin Valve Sensor using Spin Accumulation Effect for Hard Disk Drive Reader
Satoshi Shirotori, Hitoshi Iwasaki, Susumu Hashimoto, Masayuki Takagishi (Toshiba Corp.) MR2016-19 |
A tri-magnetic terminals structure based non-local spin valves (TMSV) which has dual injector with anti-parallel pined c... [more] |
MR2016-19
pp.37-42 |
| MRIS, ITE-MMS |
2015-07-10
15:45 |
Tokyo |
Waseda Univ. |
Development of high-sensitivity for non-local-spin- valves
Hitoshi Iwasaki, Susumu Hashimoto, Satoshi Shirotori, Masayuki Takagishi (Toshiba) |
[more] |
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| MRIS, ITE-MMS |
2014-06-12
15:45 |
Miyagi |
Tohoku Univ. |
High output performance of metallic spin accumulation sensor with CoFeMnSi Heusler alloy
Hitoshi Iwasaki, Satoshi Shirotori, Susumu Hashimoto, Yuzo kamiguchi, Masayuki Takagishi (Toshiba) |
[more] |
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| MRIS, ITE-MMS |
2009-07-16
15:20 |
Tokyo |
Tokyo Inst. of Tech. |
Etching damage analysis of patterned media using the Grazing Incidence X-ray Reflectively technique
Satoshi Shirotori, Yoshiyuki Kamata, Tomoyuki Maeda, Kazuto Kashiwagi, Yosuke Isowaki, Akira Kikitsu (Toshiba Corp.) MR2009-17 |
A Co/Pt patterned medium was fabricated by an Ar ion etching process through a self-assembled polymer mask with a diamet... [more] |
MR2009-17
pp.25-30 |
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