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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC |
2024-02-28 13:40 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Test Point Selection Method for Multi-Cycle BIST Using Deep Reinforcement Learning Kohei Shiotani, Tatsuya Nishikawa, Shaoqi Wei, Senling Wang, Hiroshi Kai, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.) DC2023-98 |
Multi-cycle BIST is a test method that performs multiple captures for each scan pattern, proving effective in reducing t... [more] |
DC2023-98 pp.23-28 |
DC |
2023-02-28 14:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg (Primary: On-site, Secondary: Online) |
Test Point Selection Method Using Graph Neural Networks and Deep Reinforcement Learning Shaoqi Wei, Kohei Shiotani, Senling Wang, Hiroshi Kai, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.) DC2022-87 |
It is well known that selecting the optimal test point to maximize the fault coverage is NP-hard. Conventional heuristic... [more] |
DC2022-87 pp.27-32 |
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