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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| SS | 2017-03-09 11:25 |
Okinawa | A study of Relationship between Java Method Name and Implementation toward Buggy Method Prediction Sho Suzuki, Hirohisa Aman, Minoru Kawahara (Ehime Univ.)  SS2016-64 |
This paper focuses on names of Java methods and their implementations for evaluating source code quality. A first word ... [more] |
SS2016-64 pp.25-30 |
|
| IE, ITS, ITE-AIT, ITE-HI, ITE-ME, ITE-MMS, ITE-CE [detail] | 2017-02-20 10:30 |
Hokkaido | Hokkaido Univ. | Predicting View and Exit Rates on MOOC Yusuke Fukushima, Toshihiko Yamasaki, Kiyoharu Aizawa (UTokyo), Kenshiro Mori, Kensho Suzuki (Schoo) |
While massive open online courses (MOOC) have gained increasing popularity in recent years, predicting the number of stu... [more] | |
| KBSE, SS, IPSJ-SE [detail] | 2016-07-14 16:50 |
Hokkaido | A Quantitative Investigation on Source Code Quality Focusing on Length and Composition of Method Name Sho Suzuki, Hirohisa Aman, Minoru Kawahara (Ehime Univ.) SS2016-14 KBSE2016-20 |
[more] | SS2016-14 KBSE2016-20 pp.137-142 |
|
| EID, ITE-IDY, IEE-EDD, SID-JC, IEIJ-SSL [detail] | 2016-01-29 10:20 |
Toyama | Toyama Univ. | Sensing operation based on AlGaN nanorings Hoshi Takeshima, Tetsuya Kouno, Sho Suzuki (Shizuoka Univ.), Masaru Sakai (Univ. of Yamanashi), Akihiko Kikuchi, Katsumi Kishino (Sophia Univ.), Kazuhiko Hara (Shizuoka Univ.) EID2015-36 |
[more] | EID2015-36 pp.89-91 |
| EID, ITE-IDY, IEIJ-SSL, IEE-EDD, SID-JC [detail] | 2015-01-23 11:02 |
Kyoto | Ryukoku University | Investigation of optical property of triangular GaN microdisk fabricated via top-down process Sho Suzuki, Tetsuya Kouno (Shizuoka Univ.), Masaru Sakai (Univ. of Yamanashi), Katsumi Kishino (Sophia Univ.), Kazuhiko Hara (Shizuoka Univ.) EID2014-53 |
Triangular GaN microdisk arrays were fabricated by an electron-beam lithography and an inductively coupled plasma reacti... [more] | EID2014-53 pp.103-105 |
| EID, ITE-IDY, IEIJ-SSL, IEE-EDD, SID-JC [detail] | 2015-01-23 11:10 |
Kyoto | Ryukoku University | Radiation patterns of lasing light based on uasi-whispering-gallery-mode in thin hexagonal GaN microdisk Tetsuya Kouno, Sho Suzuki (Shizuoka Univ.), Masaru Sakai (Univ. of Yamanashi), Katsumi Kishino (Sophia UNiv.), Kazuhiko Hara (Shizuoka Univ.) EID2014-54 |
The thin hexagonal GaN microdisks with the side length and thickness of approximately 1.5 um and 250 nm, respectively, w... [more] | EID2014-54 pp.107-109 |
| EID, ITE-IDY, IEIJ-SSL, IEE-EDD, SID-JC [detail] | 2014-01-24 14:26 |
Niigata | Niigata University | Optically pumped lasing action in hexagonal GaN microdisk array fabricated via top-down process Sho Suzuki, Tetsuya Kouno (Shizuoka Univ.), Koji Ynamano, Katsumi Kishino (Sophia Univ.), Kazuhiko Hara (Shizuoka Univ.) EID2013-15 |
Hexagonal GaN microdisk array was fabricated by an electron-beam lithography and an inductively coupled plasma reactive ... [more] | EID2013-15 pp.29-31 |
| SS | 2010-08-05 16:00 |
Hokkaido | Asahikawa Shimin-Bunka-Kaikan (Civic Culture Hall) | Argument Filterings and Usable Rules in Higher-Order Rewrite Systems Sho Suzuki, Keiichirou Kusakari (Nagoya Univ.), Frederic Blanqui (INRIA) SS2010-24 |
The static dependency pair method is a method for proving the termination of higher-order rewrite systems {\em \`a la} ... [more] |
SS2010-24 pp.47-52 |
| SS | 2009-12-17 15:50 |
Kagawa | Kagawa Univ. | Argument Filtering and Usable Rules in Higher-Order Rewrite Systems Sho Suzuki, Keiichirou Kusakari, Toshiki Sakabe, Masahiko Sakai, Naoki Nishida (Nagoya Univ.) SS2009-39 |
Simply-typed term rewriting systems (STRSs) and higher-order rewrite systems (HRSs) have been proposed to extend term r... [more] |
SS2009-39 pp.25-30 |
| SDM | 2007-06-08 13:35 |
Hiroshima | Hiroshima Univ. ( Faculty Club) | Impact of Interface Reactions on Electrical Characteristics of Ge/High-k Devices Koji Kita, Hideyuki Nomura, Sho Suzuki, Toshitake Takahashi, Tomonori Nishimura, Akira Toriumi (Univ.of Tokyo) SDM2007-47 |
The impact of high-k material selection on the electrical characteristics of high-k/Ge MIS capacitors was investigated. ... [more] | SDM2007-47 pp.85-90 |
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