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All Technical Committee Conferences (Searched in: All Years)
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| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| ED, MW |
2012-01-11
14:05 |
Tokyo |
Kikai-Shinko-Kaikan Bldg |
Photon-recycling GaN p+n Diodes
Kazuhiro Mochizuki (Hitachi, Ltd.), Kazuki Nomoto, Yoshitomo Hatakeyama, Hideo Katayose (Hosei Univ.), Tomoyoshi Mishima, Naoki Kaneda, Tadayoshi Tsuchiya (Hitachi Cable, Ltd.), Akihisa Terano, Takashi Ishigaki, Tomonobu Tsuchiya, Ryuta Tsuchiya (Hitachi, Ltd.), Tohru Nakamura (Hosei Univ.)  ED2011-125 MW2011-148 |
Photon recycling was used to increase ionization of Mg in GaN p+n diodes by reducing anode radius down to 20 microns. Th... [more] |
ED2011-125 MW2011-148
pp.35-40 |
| ED, CPM, LQE |
2006-10-05
16:10 |
Kyoto |
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Temperature Distribution Analysis of AlGaN/GaN HFETs Operated at High Voltage Using Micro-Raman Spectroscopy
Kenichi Kosaka, Tatsuya Hujishima (Ritsumeikan Univ.), Kaoru Inoue (FED), Akihiro Hinoki (Ritsumeikan Univ.), Tomoaki Yamada, Tadayoshi Tsuchiya, Junjiroh Kikawa, Shinichi Kamiya (FED), Akira Suzuki (Ritsumeikan Univ./FED), Tsutomu Araki, Yasushi Nanishi (Ritsumeikan Univ.) |
[more] |
ED2006-159 CPM2006-96 LQE2006-63
pp.39-43 |
| LQE, ED, CPM |
2005-10-13
16:00 |
Shiga |
Ritsumeikan Univ. |
Study on correlation between the leakage current of GaN-layer and the luminescence intensity
Akihiro Hinoki (Ritsumeikan Univ.), , Tadayoshi Tsuchiya, Tomoyuki Yamada, Masayuki Iwami (FED), Junjiroh Kikawa, Tsutomu Araki, Akira Suzuki, Yasushi Nanishi (Ritsumeikan Univ.) |
[more] |
ED2005-133 CPM2005-120 LQE2005-60
pp.71-74 |
| LQE, ED, CPM |
2005-10-13
16:20 |
Shiga |
Ritsumeikan Univ. |
Gate Leakage Current in AlGaN/GaN High Electron Mobility Transistors
Tomoyuki Yamada, Tadayoshi Tsuchiya, Junjiroh Kikawa, Masayuki Iwami (R&D Association for Future Electron Devices), Tsutomu Araki, Akira Suzuki, Yasushi Nanishi (Ritsumeikan Univ.) |
[more] |
ED2005-134 CPM2005-121 LQE2005-61
pp.75-78 |
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