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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM |
2018-11-08 13:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Talk]
Device Simulation of Reliability for Advanced Semiconductor Devices Takamitsu Ishihara, Kazuya Matsuzawa, Takeshi Naito, Sadayuki Yoshitomi (TMC) SDM2018-67 |
[more] |
SDM2018-67 pp.17-22 |
SDM |
2014-11-06 14:40 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Talk]
Modeling and Simulation of Charge-Trapping Memory and Reliability Issues Takamitsu Ishihara, Naoki Yasuda, Shosuke Fujii (Toshiba) SDM2014-102 |
Charge-trapping memory is one of the most promising candidates as the next generation memory. The complicated operation ... [more] |
SDM2014-102 pp.37-42 |
CAS (2nd) |
2010-10-06 09:45 |
Chiba |
Makuhari Messe |
[Invited Talk]
Impact of DFR simulation from device to circuit Kazuya Matsuzawa, Daisuke Hagishima, Takamitsu Ishihara (Advanced LSI Technology Lab. TOSHIBA) |
Long term-reliability must be considered in the value of LSI as well as function and performance. Conventionally, the LS... [more] |
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SDM |
2009-06-19 15:40 |
Tokyo |
An401・402 Inst. Indus. Sci., The Univ. of Tokyo |
Intrinsic Correlation between Mobility Reduction and Vt shift due to Interface Dipole Modulation in HfSiON/SiO2 stack by La or Al addition Kosuke Tatsumura, Takamitsu Ishihara, Seiji Inumiya, Kazuaki Nakajima, Akio Kaneko, Masakazu Goto, Shigeru Kawanaka, Atsuhiro Kinoshita (Toshiba Corp.) SDM2009-39 |
Intrinsic correlation between mobility reduction by remote Coulomb scattering (RCS) and threshold voltage shift (ΔVt), b... [more] |
SDM2009-39 pp.71-76 |
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