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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
RCC, MICT |
2019-05-29 15:30 |
Tokyo |
TOKYO BIG SIGHT |
[Poster Presentation]
Power Transfer Scheduling Considering Channel State in Wireless Powered Sensor Networks Tatsuya Ishida, Shinsuke Tanaka, Hiroyuki Yomo (Kansai Univ.) RCC2019-9 MICT2019-9 |
In order to realize battery-less wireless sensor networks, WPSNs (Wireless Powered Sensor Networks) are actively studied... [more] |
RCC2019-9 MICT2019-9 pp.41-46 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-12-01 13:15 |
Fukuoka |
Kyushu University |
[Invited Talk]
Monolithic 3D-FPGA with TFT SRAM over 90nm 9 layer Cu CMOS Tatasuya Naito, Tatsuya Ishida (Toshiba), Takeshi Onoduka (Covalent Materials), Masahito Nishigoori, Takeo Nakayama, Yoshihiro Ueno, Yasumi Ishimoto, Akihiro Suzuki, Chung Weicheng (Toshiba), Raminda Madurawe (readyASIC), Sheldon Wu (China International Intellectual Property Services), Shu Ikeda (tei Solutions), Hisato Oyamatsu (Toshiba) RECONF2010-50 |
[more] |
RECONF2010-50 pp.65-69 |
ICD, SDM |
2005-08-19 14:40 |
Hokkaido |
HAKODATE KOKUSAI HOTEL |
Robust Device Design in FinFET SRAM for hp22nm Technology Node Kimitoshi Okano, Tatsuya Ishida, Takahiko Sasaki, Takashi Izumida, Masaki Kondo, Makoto Fujiwara, Nobutoshi Aoki, Satoshi Inaba, Nobuaki Otsuka, Kazunari Ishimaru, Hidemi Ishiuchi (Toshiba) |
Feasibility of FinFET SRAM operation at hp22nm technology node has been studied by device and circuit simulation from th... [more] |
SDM2005-154 ICD2005-93 pp.67-72 |
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