|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
PRMU, BioX |
2017-03-20 10:00 |
Aichi |
|
Selection of Near-Boundary Data for Semi-Supervised Learning Ryohei Tanaka, Xiao Ding, Soichiro Ono, Akio Furuhata (Toshiba) BioX2016-33 PRMU2016-196 |
Semi-supervised learning (SSL) is a technique which makes use of unlabeled data in addition to labeled data to obtain be... [more] |
BioX2016-33 PRMU2016-196 pp.1-6 |
IE, MVE |
2008-07-15 10:20 |
Nagano |
Shinshu University |
Study of Stereoscopic Constrast Enhancement Based on Local Contrast and Distance Information Xiao Ding, Jun Ohya, Takashi Kawai, Nobuaki Abe (Waseda Univ.) IE2008-41 MVE2008-35 |
[more] |
IE2008-41 MVE2008-35 pp.49-54 |
PRMU, IE |
2008-03-11 08:50 |
Ishikawa |
|
Image Contrast Enhancement Based on Distance Information Xiao Ding, Jun Ohya, Takashi Kawai, Nobuaki Abe (Waseda Univ.) IE2007-303 PRMU2007-287 |
Image enhancement, especially color image enhancement is a critical area in image processing research. Image contrast en... [more] |
IE2007-303 PRMU2007-287 pp.267-270 |
IE |
2007-03-19 14:00 |
Aichi |
|
Study of Image Contrast Enhancement Based on Shadow and Non-shadow Area Xiao Ding, Jun Ohya (Waseda Univ.) |
Image enhancement, especially color image enhancement is a critical area in image processing research. Image contrast en... [more] |
IE2006-284 pp.53-58 |
|
|
|
Copyright and reproduction :
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
|
[Return to Top Page]
[Return to IEICE Web Page]
|