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R
,
ED
,
SDM
2005-11-25
14:00
Osaka
Central Electric Club
Localization Method of Failure Point with Scan Chain
Takeshi Kataoka
,
Hisakazu Watanabe
,
Yasushi Kannan
,
Masaji Tanaka
(
Matsushita Electric Industrial
)
Fault diagnosis system which extracts a suspicion failure node of the logic circuit by using LSI tester and analytical ...
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R2005-42
ED2005-177
SDM2005-196
pp.25-30
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