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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 5 of 5  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
US 2011-11-24
16:15
Shizuoka Tokai Univ. Methods of Carrier Ultrasound Reducing of Parametric Loudspeaker
Yoshiyuki Hara, Toshikazu Horino, Hideyuki Nomura, Tomoo Kamakura (UEC) US2011-75
A parametric loudspeaker using the self-demodulation of a finite-amplitude ultrasonic wave is promising for improving so... [more] US2011-75
pp.53-58
US 2010-04-22
13:20
Tokyo The University of Electro-Communications Driving for Reducing Carrier Ultrasound of Parametric Loudspeaker
Yoshiyuki Hara, Yoshu Maekawa, Hideyuki Nomura, Tomoo Kamakura (UEC) US2010-1
A parametric loudspeaker using the self-demodulation of a finite-amplitude ultrasonic wave by the
nonlinearity of the a... [more]
US2010-1
pp.1-4
EA, US
(Joint)
2010-01-25
15:00
Osaka   Out-of-phase excitation for parametric loudspeaker -- Effect of arrangment of ultrasonic projectors on parametric fields --
Akira Kikuchi, Yoshu Maekawa, Yoshiyuki Hara, Tomoo Kamakura, Hideyuki Nomura, Shinichi Sakai (Univ. of Electro-Comm.) US2009-95 EA2009-103
A parametric loudspeaker is practically promising because its directivity is
much sharper than that of a conventional l... [more]
US2009-95 EA2009-103
pp.43-46(US), pp.25-28(EA)
ED, CPM, LQE 2006-10-05
16:35
Kyoto   Influences of nitrogen plasma on GaN growth on Si substrate by ECR-MBE growth method
Tokuo Yodo, Yuki Shiraishi, Kiyotaka Hirata, Hiroyuki Tomita, Norikaki Nishie, Hiroaki Horibe, Keigo Iwata, Yoshiyuki Harada (Osaka Inst. of Tech.)
 [more] ED2006-160 CPM2006-97 LQE2006-64
pp.45-49
ED, CPM, LQE 2006-10-06
16:50
Kyoto   Effects of ion damage reduction due to N2+ on InN film growth on Si substrate by ECR-MBE method
Tokuo Yodo, Teruya Shimada, Sumito Tagawa, Ryo Nishimoto, Shiro Hidaka, Keita Ishi, Hiroshi Segawa, Junichi Hirakawa, Yoshiyuki Harada (Osaka Inst.of Tech.)
The problem of ECR-MBE method is to generate the N2+ ion from ECR plasma during growth that damages the film. The bad in... [more] ED2006-175 CPM2006-112 LQE2006-79
pp.121-125
 Results 1 - 5 of 5  /   
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