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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
IN, NS (Joint) |
2011-03-03 11:50 |
Okinawa |
Okinawa Convention Center |
Evaluation of Resource Usage on Data Collection and Distribution Platform Masaaki Takase, Kouichirou Amemiya (FUJITSU LABS.), Anna Kawano, Ryuji Oda (Fujitsu Kyushu Network Technologies Limited), Ken-ichi Abiru (FUJITSU LABS.) IN2010-173 |
[more] |
IN2010-173 pp.175-180 |
ICD |
2007-04-13 09:40 |
Oita |
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[Invited Talk]
A 65 nm Embedded SRAM with Wafer Level Burn-In Mode, Leak-Bit Redundancy and E-trim Fuse for Known Good Die Shigeki Ohbayashi, Makoto Yabuuchi, Kazushi Kono (Renesas Technology), Yuji Oda (Shikino High-Tech), Susumu Imaoka (Renesas Design), Keiichi Usui (Daioh Electric), Toshiaki Yonezu, Takeshi Iwamoto, Koji Nii, Yasumasa Tsukamoto, Masashi Arakawa, Takahiro Uchida, Hiroshi Makino, Koichiro Ishibashi, Hirofumi Shinohara (Renesas Technology) ICD2007-11 |
We propose a Wafer Level Burn-In (WLBI) mode, a leak-bit redundancy and a small, highly reliable Cu E-trim fuse repair s... [more] |
ICD2007-11 pp.59-64 |
ICD |
2006-04-14 13:50 |
Oita |
Oita University |
Worst-Case Ananlysis to Obtain Stable Read/Write DC Margin of High Density 6T-SRAM-Array with Local Vth Variability Yasumasa Tsukamoto, Koji Nii (Renesas Technology), Susumu Imaoka (Renesas Design), Yuji Oda (Shikino High-Tech.), Shigeki Ohbayashi, Makoto Yabuuchi, Hiroshi Makino, Koichiro Ishibashi, Hirofumi Shinohara (Renesas Technology) |
[more] |
ICD2006-18 pp.97-102 |
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