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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EMCJ |
2019-01-18 10:50 |
Osaka |
Osaka University |
Results of EMC round robin test on emission and immunity test.
-- (3) Conducted immunity round robin test -- Yoshitsugu Okuda (KEC Electronic Industry Development Center), Yasushi Asaji (Murata Manufacturing), Takashi Usui (YAMAHA), Mikio Okumura (OMRON), Kazuhiro Kobayashi (IPS), Hiroyoshi Shida (Tokin EMC Engineering), Hisashi Ninomiya (Roland), Mitsuyoshi Maishima (Hamamatsu Photonics), Osami Wada (Kyoto Univ) EMCJ2018-100 |
[more] |
EMCJ2018-100 pp.1-5 |
ITS, IE, ITE-MMS, ITE-HI, ITE-ME, ITE-AIT [detail] |
2018-02-16 13:45 |
Hokkaido |
Hokkaido Univ. |
* Kazuki Haneishi, Hiromi Nakamura, Takafusa Haneishi (Rolan), Masao Kasuga (Grad.School,Sakushin) |
[more] |
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EMCJ, IEE-EMC, MW, EST [detail] |
2016-10-20 09:25 |
Miyagi |
Tohoku Univ. |
Results of EMC round robin test on emission and immunity test.
-- (2) Radiated immunity round robin test -- Yoshitsugu Okuda, Masahiro Inoue (KEC), Hiro Shida (Tokin), Hisashi Ninomiya (Roland), Kenji Masaoka (KEC), Minoru Yamanaka (UL), Osami Wada (Kyo Dai) EMCJ2016-61 MW2016-93 EST2016-57 |
In the previous report, we explained Round-Robin tests on radiated and conducted emission test research report/result. I... [more] |
EMCJ2016-61 MW2016-93 EST2016-57 pp.5-10 |
ITS, IE, ITE-AIT, ITE-HI, ITE-ME, ITE-MMS, ITE-CE [detail] |
2016-02-23 09:15 |
Hokkaido |
Hokkaido Univ. |
Study in the analysis of the factor relevant to continuous development of a company
-- Examination on the relation between employee satisfactory and corporate earnings -- Kazuki Hneishi (Rolan), Takafusa Haneishi, Masao Kasuga (Grad.School、Sakushin) |
[more] |
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EMCJ |
2015-09-04 15:10 |
Kyoto |
Keihanna Plaza |
Results of EMC round robin test on emission and immunity test
-- (1) Radiated and conducted emission tests -- Yoshitsugu Okuda (KEC), Yasushi Asaji (Murata), Chiaki Asaba (ADVANTEST), Mikio Okumura (OMRON), Hiro Shida (Tokin), Hisashi Ninomiya (Roland), Kenji Masaoka (KEC), Yoshihide Mimura (Intertek), Osami Wada (Kyodai) EMCJ2015-57 |
[more] |
EMCJ2015-57 pp.25-30 |
EMCJ, EMD |
2012-07-20 15:05 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Bore Sighting Method and Its Simplification for Radiated Emission Measurement above 1 GHz Band Ikuya Minematsu (KEC), Tatsurou Horiuchi (Roland), Hiroshi Kitada (MURATA), Masaru Yoshiwara (RIKEN), Yukio Kajita (KITAGAWA INDUSTRIES), Tetsuya Nakamura (TOYO), Osami Wada (Kyoto), Hisashi Ninomiya (Roland) EMCJ2012-46 EMD2012-21 |
[more] |
EMCJ2012-46 EMD2012-21 pp.31-36 |
EMCJ, ITE-BCT |
2010-03-12 14:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Difference of conducted emission test result at mains port depending on the change of stray capacitance between "EUT" and "the horizontal ground reference plane" Hoichi Iwamoto ., Mitsuo Shida (Roland Corp.) EMCJ2009-130 |
[more] |
EMCJ2009-130 pp.25-30 |
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