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| Chair |
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Nobuo Kuwabara (Kyushu Inst. of Tech.) |
| Vice Chair |
|
Masao Taki (Tokyo Metropolitan Univ.) |
| Secretary |
|
Kensei Ou (Nagoya Inst. of Tech.), Kuniaki Utsumi (KEC) |
| Assistant |
|
Yoshito Hirai (TDK), Takahiro Aoyagi (Tokyo Inst. of Tech.) |
|
|
|
| Chair |
|
Makoto Hasegawa (Chitose Inst. of Science and Tech.) |
| Vice Chair |
|
Junya Sekikawa (Shizuoka Univ.), Nobuhiro Kuga (Yokohama National Univ.) |
| Secretary |
|
Yasuhiro Hattori (Sumitomo Denso), Yoshiteru Abe (NTT) |
| Assistant |
|
Takahiro Ueno (Nippon Inst. of Tech.) |
|
| Conference Date |
Fri, Jul 20, 2012 12:45 - 17:40 |
| Topics |
Discharge, EMC, etc. |
| Conference Place |
Kikai-Shinko-Kaikan Building (Japan Society for the Promotion of Machine Industry) |
| Address |
3-5-8 Shibakoen, Minato-ku, |
| Transportation Guide |
http://www.jspmi.or.jp/ |
| Sponsors |
This conference is co-sponsored by IEEE EMC Society Japan Chapter and URSI-E. This conference is technical co-sponsored by IEEE EMC Society Sendai Chapter and Japan Institute of Electronics Packaging Electromagnetic Technology Committee.
|
Copyright
and
reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Fri, Jul 20 PM EMD
12:45 - 14:55 |
| |
12:45-12:50 |
Opening Address ( 5 min. ) |
| (1) |
12:50-13:15 |
Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism
-- A fundamental study on the performance of the oscillating mechanism (23) --  EMCJ2012-41 EMD2012-16 |
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Kouki Takeda, Naoki Masuda, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) |
| (2) |
13:15-13:40 |
Degradation Phenomenon of Electrical Contacts using some Oscillating Mechanisms
-- Modeling about Fluctuation of Contact Resistance (24) -- EMCJ2012-42 EMD2012-17 |
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) |
| (3) |
13:40-14:05 |
Magnetically Blowing out of Break Arcs Restricted by the Wall EMCJ2012-43 EMD2012-18 |
Hitoshi Ono, Junya Sekikawa (Shizuoka Univ) |
| (4) |
14:05-14:30 |
Electric-Resistance Measurement of Magnetic Pulse Welding Samples EMCJ2012-44 EMD2012-19 |
Eiki Kabasawa, Keigo Okagawa, Masaki Ishibashi, Tomokatsu Aizawa (TMCIT) |
| (5) |
14:30-14:55 |
Parallel Seam Welding of Aluminum and Copper Sheets for Electro-Conductive Connection by Magnetic Pulse Welding Method EMCJ2012-45 EMD2012-20 |
Tomokatsu Aizawa, Kazuo Matsuzawa, Keigo Okagawa (Tokyo Metropolitan College) |
| |
14:55-15:05 |
Break ( 10 min. ) |
Fri, Jul 20 PM EMCJ
15:05 - 16:45 |
| (6) |
15:05-15:30 |
Bore Sighting Method and Its Simplification for Radiated Emission Measurement above 1 GHz Band EMCJ2012-46 EMD2012-21 |
Ikuya Minematsu (KEC), Tatsurou Horiuchi (Roland), Hiroshi Kitada (MURATA), Masaru Yoshiwara (RIKEN), Yukio Kajita (KITAGAWA INDUSTRIES), Tetsuya Nakamura (TOYO), Osami Wada (Kyoto), Hisashi Ninomiya (Roland) |
| (7) |
15:30-15:55 |
Study of correlation between kit-module level and electric field strength by using SO-DIMM evaluation model EMCJ2012-47 EMD2012-22 |
Nobuo Kuwabara (KIT), Hirokazu Tohya (ICAST), Hidenori Muramatsu (VCCI), Kengo Mori (I-O DATA DEVIC), Toshiki Shimasaki (NEC Engineering) |
| (8) |
15:55-16:20 |
Energy-based analysis of electrostatic discharge current
-- Assessment of high oscillations in ESD waveform -- EMCJ2012-48 EMD2012-23 |
Masao Masugi (Ritsumeikan Univ.), Norihito Hirasawa, Yoshiharu Akiyama (NTT), Kazuo Murakawa (NTT east) |
| (9) |
16:20-16:45 |
SAR Evaluation of Capsule Endoscope with Spatial Diversity Reception EMCJ2012-49 EMD2012-24 |
Daisuke Anzai, Sho Aoyama, Masafumi Yamanaka, Jianqing Wang (Nagoya Inst. of Tech.) |
Fri, Jul 20 PM Special lecture
16:45 - 17:40 |
| (10) |
16:45-17:35 |
[Special Talk]
Study on Exposure System for Biological Effect Test of Radio Wave EMCJ2012-50 EMD2012-25 |
Jianqing Wang (Nagoya Inst. of Tech.) |
| |
17:35-17:40 |
Closing Address ( 5 min. ) |
| Announcement for Speakers |
| General Talk | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
| Special Talk | Each speech will have 40 minutes for presentation and 10 minutes for discussion. |
| Contact Address and Latest Schedule Information |
| EMCJ |
Technical Committee on Electromagnetic Compatibility (EMCJ) [Latest Schedule]
|
| Contact Address |
Takahiro Aoyagi (Tokyo Institute of Technology)
2-12-1-W9-110 Ookayama, Meguro-ku, Tokyo 152-8552, JAPAN
TEL +81-3-5734-2992, FAX +81-3-5734-2992
emcj   |
| EMD |
Technical Committee on Electromechanical Devices (EMD) [Latest Schedule]
|
| Contact Address |
Makoto Hasegawa（Chitose Inst. of Science and Technorogy）
TEL (0123)27-6059、FAX (0123)27-6059
E-:     p  n  
Junya Sekikawa (Shizuoka Univ.)
TEL (053) 478-1618、FAX (053) 478-1618
E-: tj kipc  
Yasuhiro Hattori（Sumitomo Wiring Systems, Ltd.)
TEL (059)382-8970、FAX (059)382-8591
E-:     -t  sws |
| Announcement |
Latest information will be presented on the homepage:
http://www.ieice.org/es/emd/jpn/ |
Last modified: 2012-05-22 15:34:09
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