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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
AP (2nd) |
2018-05-31 13:55 |
Overseas |
The University of Da nang, University of Science and Technology |
[Invited Talk]
High capacity encoding chipless RFID tag based on multi branch H-shaped resonator for sensing application Thanh Huong Nguyen, Si Hong Hoang, Thi Lan Huong Nguyen (School of Electrical Engineering), Van Phuong Ha (Faculty of Electrical Engineering Technology), Viet Tung Nguyen, Trung Kien Dao (International Research Institute MICA) |
[more] |
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EMD |
2010-11-11 14:15 |
Overseas |
Xi'an Jiaotong University |
Arc Erosion of Silver/Tungsten Contact Material under Low Voltage and Small Current at 400Hz and 50Hz Jing Li, Zhiying Ma (Xjtu School of Electrical Engineering), Jianming Li (Hunan Inst. of Engineering) EMD2010-84 |
Researches indicated that the form of silver/tungsten contact material arc burnout at 400Hz is stasis, not an eddy flow ... [more] |
EMD2010-84 pp.73-76 |
EA, US (Joint) |
2010-01-25 11:25 |
Osaka |
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Discussion on thermal diffusivities of commercial PVDF films measured by laser induced carbon heat source method Yoshiaki Tokunaga, Masatoshi Yoshimura, Hiroyuki Kobayashi, Koji Aizawa (Kanazawa Inst. of Tech.) US2009-90 |
This paper describes experimental discussion on thermal diffusivities of commercial PVDF films with 28, 52, and 110[μm] ... [more] |
US2009-90 pp.17-22 |
SDM, ED |
2009-06-26 10:00 |
Overseas |
Haeundae Grand Hotel, Busan, Korea |
Multi-level reading method by using PCI(Paierd Cell Interference) in vertical NAND flash memory. Yoon Kim, Seongjae Cho, Jang-Gn Yun, Il Han Park, Gil Sung Lee, Doo-Hyun Kim, Dong Hua Li, Se Hwan Park, Wandong Kim, Wonbo Shim, Byung-Gook Park (Seoul National Univ.) ED2009-96 SDM2009-91 |
[more] |
ED2009-96 SDM2009-91 pp.197-200 |
SDM, ED |
2009-06-26 11:45 |
Overseas |
Haeundae Grand Hotel, Busan, Korea |
Study on Dependence of Self-Boosting Channel Potential on Device Scale and Doping Concentration in 2-D and 3-D NAND-Type Flash Memory Device. Seongjae Cho, Jung Hoon Lee, Yun Kim, Jang-Gn Yun, Hyungcheol Shin, Byung-Gook Park (Seoul National Univ.) ED2009-101 SDM2009-96 |
[more] |
ED2009-101 SDM2009-96 pp.219-222 |
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