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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM, OME |
2010-04-23 11:40 |
Okinawa |
Okinawa-Ken-Seinen-Kaikan Bldg. |
Simulation of dependency of photo current on intrinsic length in a-Si and c-Si thin film PIN photo sensor Akinori Sakamoto, Takashi Noguchi (University of the Ryukyus), Tadashi Ohachi (Doushisha University), Fumiaki Oshiro, Jean de Dieu Mugiraneza (University of the Ryukyus) SDM2010-5 OME2010-5 |
For hydrogenated amorphous silicon (a-Si:H) and crystal silicon (c-Si) thin film PIN photo sensors, the dependence of ph... [more] |
SDM2010-5 OME2010-5 pp.19-22 |
SDM, OME |
2010-04-23 13:30 |
Okinawa |
Okinawa-Ken-Seinen-Kaikan Bldg. |
Influence of Grain Size on Gate Voltage Swing and Threshold Voltage of Poly-Si Thin Film Transistor Fumiaki Oshiro, Akinori Sakamoto, Takashi Noguchi (Univ. of Ryukyus), Tadashi Ohachi (Doshisha Univ.) SDM2010-7 OME2010-7 |
A model of defects in poly-Si film by using grain size was proposed. The gate voltage swing factor S which related to th... [more] |
SDM2010-7 OME2010-7 pp.29-32 |
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