IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 4 of 4  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
ED 2012-11-19
14:25
Osaka Osaka Univ. Nakanoshima Center Fabrication of graphene edge emitters and their field emission properties
Katsuhisa Murakami (Univ. Tsukuba), Hisato Yamaguchi (Rutgers Univ.), Fujio Wakaya, Mikio Takai (Osaka Univ.), Manish Chhowalla (Rutgers Univ.) ED2012-55
The electron emission properties of thin edges of reduced graphene oxide (rGO) were investigated by field emission micro... [more] ED2012-55
pp.7-10
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2011-11-30
10:05
Miyazaki NewWelCity Miyazaki Capture power reduction in multi-cycle test structure
Hisato Yamaguchi, Makoto Matsuzono, Kohei Miyase, Yasuo Sato, Seiji Kajihara (KIT) VLD2011-83 DC2011-59
Power consumption during Built-In Self-Test(BIST) is far larger than that of normal operation. Therefore, it may lead to... [more] VLD2011-83 DC2011-59
pp.179-183
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2010-11-29
15:25
Fukuoka Kyushu University Evaluation of Multi-Cycle Test with Partial Observation in Scan BIST Structure
Hisato Yamaguchi, Makoto Matsuzono, Yasuo Sato, Seiji Kajihara (Kyushu Inst. of Tech./JST) VLD2010-61 DC2010-28
Reducing test data volume is important for field BIST because the data should be stored on a chip. In this paper, for th... [more] VLD2010-61 DC2010-28
pp.31-36
ED 2010-10-25
14:15
Kyoto   Field emission mechanism of n-type semiconducting diamond with negative electron affinity
Takatoshi Yamada, Masataka Hawagawa (AIST), Christoph E. Nebel (FIA), Yuki Kudo, Hisato Yamaguchi, Tomoaki Masuzawa, Ken Okano (ICU) ED2010-131
 [more] ED2010-131
pp.17-21
 Results 1 - 4 of 4  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan