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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ED |
2012-11-19 14:25 |
Osaka |
Osaka Univ. Nakanoshima Center |
Fabrication of graphene edge emitters and their field emission properties Katsuhisa Murakami (Univ. Tsukuba), Hisato Yamaguchi (Rutgers Univ.), Fujio Wakaya, Mikio Takai (Osaka Univ.), Manish Chhowalla (Rutgers Univ.) ED2012-55 |
The electron emission properties of thin edges of reduced graphene oxide (rGO) were investigated by field emission micro... [more] |
ED2012-55 pp.7-10 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2011-11-30 10:05 |
Miyazaki |
NewWelCity Miyazaki |
Capture power reduction in multi-cycle test structure Hisato Yamaguchi, Makoto Matsuzono, Kohei Miyase, Yasuo Sato, Seiji Kajihara (KIT) VLD2011-83 DC2011-59 |
Power consumption during Built-In Self-Test(BIST) is far larger than that of normal operation. Therefore, it may lead to... [more] |
VLD2011-83 DC2011-59 pp.179-183 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-29 15:25 |
Fukuoka |
Kyushu University |
Evaluation of Multi-Cycle Test with Partial Observation in Scan BIST Structure Hisato Yamaguchi, Makoto Matsuzono, Yasuo Sato, Seiji Kajihara (Kyushu Inst. of Tech./JST) VLD2010-61 DC2010-28 |
Reducing test data volume is important for field BIST because the data should be stored on a chip. In this paper, for th... [more] |
VLD2010-61 DC2010-28 pp.31-36 |
ED |
2010-10-25 14:15 |
Kyoto |
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Field emission mechanism of n-type semiconducting diamond with negative electron affinity Takatoshi Yamada, Masataka Hawagawa (AIST), Christoph E. Nebel (FIA), Yuki Kudo, Hisato Yamaguchi, Tomoaki Masuzawa, Ken Okano (ICU) ED2010-131 |
[more] |
ED2010-131 pp.17-21 |
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