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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EMCJ, PEM (Joint) |
2014-11-14 15:15 |
Tokyo |
AIST Tokyo Waterfront |
A Study of Electrostatic Discharge Immunity Testing for Wearable Equipment Takeshi Ishida (Noiseken/UEC), Fengchao Xiao, Yoshio Kami, Osamu Fujiwara, Shuichi Nitta (UEC) EMCJ2014-72 |
The electrostatic discharge (ESD) immunity test for electronic equipment is specified in the international standard IEC ... [more] |
EMCJ2014-72 pp.31-35 |
EMCJ, MW, EST |
2011-05-27 11:00 |
Tokyo |
NICT |
[Special Talk]
Challenges for EMC technologies Shuichi Nitta (TUAT) EMCJ2011-26 MW2011-23 EST2011-19 |
[more] |
EMCJ2011-26 MW2011-23 EST2011-19 p.99 |
EMCJ, ITE-BCT |
2009-03-13 16:35 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Special Talk]
A Standpoint of EMC for Reliability Engineering Shuichi Nitta (Salesian Polytechnic) EMCJ2008-125 |
This report reviews the widely used reliability evaluation method, proposes the introduction of EMC (immunity) to reliab... [more] |
EMCJ2008-125 pp.67-71 |
EMCJ |
2007-12-07 11:00 |
Shizuoka |
Create HAMAMATSU |
A Study on the Transmitting Characteristics of Electro-Magnetic Wave Passing through the Inerstice between Two Metal Plates-Part 1
-- A Study Based on the Wave Guide Model -- Yuichi Watanabe (JFE R&D Co.), Shuichi Nitta (Salesian Polytechnic) EMCJ2007-97 |
The attenuation characteristics of electro-magnetic wave transmitting through the part where two metal plates lap, are d... [more] |
EMCJ2007-97 pp.7-12 |
EMCJ |
2007-12-07 11:25 |
Shizuoka |
Create HAMAMATSU |
A Study on the Transmitting Characteristics of Electro-Magnetic Wave Passing through the Inerstice between Two Metal Plates-Part 2
-- An Influence of the Conducting Parts between Two Metal Plates on Electro-Magnetic Wave Transmission -- Yuichi Watanabe (JFE R&D Co.), Shuichi Nitta (Salesian Polytechnic) EMCJ2007-98 |
The method detecting portions of conducting parts between lapped two metal plates (at least, one of the plates should be... [more] |
EMCJ2007-98 pp.13-18 |
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