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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| PRMU, BioX | 2018-03-18 14:20 |
Tokyo | A Study of Fast Image Matching Method Under Translation, Scale and Rotation Toru Takahashi, Kengo Makino, Yuta Kudo, Rui Ishiyama (NEC)  BioX2017-42 PRMU2017-178 |
This paper presents a fast pattern matching method which covers image translation, rotation and scaling. Pattern matchin... [more] | BioX2017-42 PRMU2017-178 pp.37-42 |
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| EMM, ISEC, SITE, ICSS, IPSJ-CSEC, IPSJ-SPT [detail] | 2016-07-15 15:20 |
Yamaguchi | A Durability Evaluation for Metallic-Foil Artifact-Metrics Naoki Yoshida, Tsutomu Matsumoto (YNU) ISEC2016-37 SITE2016-31 ICSS2016-37 EMM2016-45 |
We proposed that metallic foils such as aluminum foils and gold foils can be applied to artifact-metrics, because the me... [more] | ISEC2016-37 SITE2016-31 ICSS2016-37 EMM2016-45 pp.229-236 |
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| PRMU, BioX | 2015-03-20 10:00 |
Kanagawa | How to Design Scanning Resolution in Artifact-metrics Takuya Iwayoshi, Naoki Yoshida, Tsutomu Matsumoto (YNU) BioX2014-62 PRMU2014-182 |
Artifact-metrics is a security technology which authenticates individual artifacts based on intrinsic unique features wh... [more] | BioX2014-62 PRMU2014-182 pp.141-146 |
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| BioX (2nd) |
2013-08-27 14:45 |
Osaka | The Institute of Scientific and Industrial Research, Osaka Univ. | Paper-Type Dependency in Visible-Light Paper Artifact-Metrics Kenta Hanaki, Tsutomu Matsumoto (YNU) |
Visible-light paper artifact-metrics is a paper authentication technology based on image patterns of visible light refle... [more] | |
| EMM, ISEC, SITE, ICSS, IPSJ-CSEC, IPSJ-SPT [detail] | 2013-07-18 16:40 |
Hokkaido | [Invited Talk]
Research on Information and Physical Security Technologies for Embedded Systems Tsutomu Matsumoto (Yokohama National Univ.) ISEC2013-34 SITE2013-29 ICSS2013-39 EMM2013-36 |
I describe a personal view on the information and physical security technologies for embedded systems available in sever... [more] | ISEC2013-34 SITE2013-29 ICSS2013-39 EMM2013-36 p.245 |
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| EMM, ISEC, SITE, ICSS, IPSJ-CSEC, IPSJ-SPT [detail] | 2013-07-19 12:55 |
Hokkaido | On Identification Methods for Visible-Light Paper Artifact-Metric Systems Ryosuke Suzuki, Tsutomu Matsumoto (Yokohama National Univ.) ISEC2013-41 SITE2013-36 ICSS2013-46 EMM2013-43 |
A visible-light paper artifact-metric system authenticates a piece of paper using its individual pattern of entangled fi... [more] | ISEC2013-41 SITE2013-36 ICSS2013-46 EMM2013-43 pp.289-295 |
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| IT, ISEC, WBS | 2013-03-08 11:45 |
Osaka | Kwansei Gakuin Univ., Osaka-Umeda Campus | Nano Artifact-metrics based on Resist Collapsing Tsutomu Matsumoto, Kenta Hanaki, Ryosuke Suzuki, Daiki Sekiguchi (Yokohama National Univ.), Morihisa Hoga, Yasuyuki Ohyagi (DNP), Makoto Naruse (NICT), Naoya Tate, Motoichi Ohtsu (Univ. of Tokyo) IT2012-96 ISEC2012-114 WBS2012-82 |
Artifact-metrics is an automated method of utilizing physical artifacts based on their measurable intrinsic characterist... [more] | IT2012-96 ISEC2012-114 WBS2012-82 pp.217-222 |
| IT, ISEC, WBS | 2012-03-01 10:30 |
Kanagawa | A Clone Resistance Evaluation of Visible-Light Paper Artifact-Metrics Yuki Kondo, Yasuhiro Takeuchi, Junji Shikata, Tsutomu Matsumoto (Yokohama National Univ.) IT2011-46 ISEC2011-73 WBS2011-47 |
Visible-light paper artifact-metric system is a type of authentication system using visible light patterns of paper as i... [more] | IT2011-46 ISEC2011-73 WBS2011-47 pp.1-8 |
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| IT, ISEC, WBS | 2012-03-01 10:55 |
Kanagawa | Object Verification System from Artifact-Metrics Based on Printed Ink Spread Takanori Kobayashi, Takuya Nakamura, Hiroki Sato (Chuo Univ.), Nuttapong Attrapadung, Hideki Imai (AIST) IT2011-47 ISEC2011-74 WBS2011-48 |
Artifact-Metrics is the technology of attestation or a truth judging in which the feature peculiar to an artificial thin... [more] | IT2011-47 ISEC2011-74 WBS2011-48 pp.9-13 |
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| ISEC, LOIS | 2010-11-17 15:40 |
Ibaraki | Tsukuba Univ. | A Visible-Light Artifact-Metric System which Extracts Values Unique to Individual Paper Yasuhiro Fukuda, Tsutomu Matsumoto (Yokohama National Univ.) ISEC2010-55 LOIS2010-34 |
Artifact-metrics is an automated method of authenticating physical object based on a measurable intrinsic characteristic... [more] | ISEC2010-55 LOIS2010-34 pp.37-43 |
| ISEC, IPSJ-CSEC, SITE, ICSS [detail] | 2010-07-01 14:40 |
Aomori | Hirosaki University | An Artifact-Metric System which Extracts Values Unique to Individual Paper Yasuhiro Fukuda, Tsutomu Matsumoto (Yokohama National Univ.) ISEC2010-16 SITE2010-12 ICSS2010-22 |
Artifact-metrics is an automated method of authenticating physical object based on a measurable intrinsic characteristic... [more] | ISEC2010-16 SITE2010-12 ICSS2010-22 pp.41-46 |
| ISEC, SITE, IPSJ-CSEC | 2008-07-25 11:35 |
Fukuoka | Fukuoka Institute of System LSI Design Industry | Clone Resistance of Paper Artifact-Metrics with Segmented Matching Yoichi Kobayashi, Sho Sakakura, Mitsutoshi Taira, Manabu Yamakoshi, Tsutomu Matsumoto (YNU) ISEC2008-39 |
It is desired to develop excellent counterfeit deterrence techniques for artifacts such as security documents, credentia... [more] | ISEC2008-39 pp.31-36 |
| ISEC, LOIS | 2007-11-21 14:20 |
Hyogo | Kobe University | Clone resistance in artifact-metric systems Yuko Tamura, Masashi Une (BOJ) ISEC2007-91 OIS2007-63 |
Artifact-metrics is a technique to authenticate an artifact by using its physical feature that even the manufacturer can... [more] | ISEC2007-91 OIS2007-63 pp.15-22 |
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