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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC |
2016-02-17 10:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation Fuqiang Li, Xiaoqing Wen, Stefan Holst, Kohei Miyase, Seiji Kajihara (Kyutech) DC2015-87 |
Both logic paths and clock paths are subject to the impact of IR-Drop which occurs in capture mode during scan test. Thi... [more] |
DC2015-87 pp.7-12 |
DC |
2014-06-20 14:05 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A X-Filling Method for Low-Capture-Power Scan Test Generation Fuqiang Li, Xiaoqing Wen, Kohei Miyase, Stefan Holst, Seiji Kajihara (Kyushu Inst. of Tech.) DC2014-12 |
In order to generate a low capture power test pattern, we propose an
X-filling method to suppress local switching activ... [more] |
DC2014-12 pp.15-20 |
DC |
2011-06-24 16:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Low Power At-Speed Scan Testing for LOS Scheme by Test Vector Modification Kohei Miyase, Yuta Uchinodan, Kazunari Enokimoto (KIT), Yuta Yamato (NAIST), Xiaoqing Wen, Seiji Kajihara (KIT), Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Arnaud Verazel (Lirmm) DC2011-13 |
In this paper, we present a test vector modification method to reduce launch-to-capture power for LOS scheme. The propos... [more] |
DC2011-13 pp.29-34 |
DC |
2011-02-14 10:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Capture-Safety Checking Based on Transition-Time-Relation for At-Speed Scan Test Vectors Ryota Sakai, Kohei Miyase, Xiaoqing Wen (Kyushu Inst. of Tech.), Masao Aso, Hiroshi Furukawa (RMS), Yuta Yamato (Fukuoka Ind. Sci & Tech/Fundation FIST), Seiji Kajihara (Kyushu Inst. of Tech.) DC2010-60 |
Excessive capture power in at-speed scan testing may cause timing failures, resulting in test-induced yield loss. This h... [more] |
DC2010-60 pp.7-12 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2008-11-17 13:50 |
Fukuoka |
Kitakyushu Science and Research Park |
A Capture-Safe Test Generation Scheme for At-speed Scan Testing Atsushi Takashima, Yuta Yamato, Hiroshi Furukawa, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara (Kyusyu Institute of Technology) VLD2008-62 DC2008-30 |
Capture-safety, defined as the avoidance of any timing error due to unduly high switching activity in capture mode durin... [more] |
VLD2008-62 DC2008-30 pp.13-18 |
VLD, CPSY, RECONF, DC, IPSJ-SLDM, IPSJ-ARC (Joint) [detail] |
2007-11-20 10:30 |
Fukuoka |
Kitakyushu International Conference Center |
A Transition Delay Test Generation Method for Capture Power Reduction during At-Speed Scan Testing Tomoaki Fukuzawa, Kohei Miyase, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara (KIT) VLD2007-71 DC2007-26 |
High power dissipation can occur when a response to the test vector is captured by flip-flops in at-speed scan testing, ... [more] |
VLD2007-71 DC2007-26 pp.7-12 |
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