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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
HWS, ICD [detail] |
2021-10-19 10:00 |
Online |
Online |
Evaluations of tamper resistance by Wave-FF for Power Analysis Attack on AES Tomoaki Ukezono (Fukuoka Univ.) HWS2021-41 ICD2021-15 |
Dual-Rail design represented by WDDL can be mentioned as a countermeasure against information leakage from power consump... [more] |
HWS2021-41 ICD2021-15 pp.1-6 |
CPSY, DC |
2014-04-25 14:00 |
Tokyo |
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Construction of Design Environment for Asynchronous Circuits using DDL Cell Library Masashi Imai, Hiromasa Igarashi, Sanshiro Kudo (Hirosaki Univ.) CPSY2014-2 DC2014-2 |
As the VLSI fabrication technology advances, delay variations due to random process variations, crosstalk, and aging eff... [more] |
CPSY2014-2 DC2014-2 pp.3-8 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2013-11-27 10:20 |
Kagoshima |
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Performance Evaluation of Tamper-Resistant AES Cryptographic Circuit utilizing Hybrid Masking Dual-Rail ROM Shintaro Ukai, Tsunato Nakai, Toshiki Kitamura, Takaya Kubota, Mitsuru Shiozaki, Takeshi Fujino (Ritsumeikan Univ.) CPM2013-111 ICD2013-88 |
Tamper-resistant devices require to protect cryptographic circuit from side-channel attacks such as power analysis (PA) ... [more] |
CPM2013-111 ICD2013-88 pp.19-24 |
VLD, ICD, DC, IPSJ-SLDM |
2005-11-30 17:00 |
Fukuoka |
Kitakyushu International Conference Center |
Design of High Performance and Low Power Arithmetic Circuits Considering Bit Delay Variation Kouichi Watanabe, Masashi Imai, Masaaki Kondo, Hiroshi Nakamura, Takashi Nanya (Univ. Tokyo) |
As the VLSI technology advances, delay variations will become more serious.
Delay insensitive asynchronous dual-rail ci... [more] |
VLD2005-60 ICD2005-155 DC2005-37 pp.37-42 |
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