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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2022-01-31
14:15
Online Online [Invited Talk] ****
Reika Ichihara (Kioxia) SDM2021-70
e establish an accurate picture of cycling degradation in HfO2-FeFET based on the dynamics of various charge-trapping re... [more] SDM2021-70
pp.9-11
SDM 2018-01-30
15:30
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Sub-nm EOT Ferroelectric HfO2 on p+Ge with Highly Reliable Field Cycling Properties
Xuan Tian, Lun Xu, Shigehisa Shibayama, Tomonori Nishimura, Takeaki Yajima (Univ. of Tokyo), Shinji Migita (AIST), Akira Toriumi (Univ. of Tokyo) SDM2017-96
5-nm-thick ferroelectric Y-doped HfO2 was intensively studied. The thickness dependence of ferroelectric properties indi... [more] SDM2017-96
pp.21-24
R 2010-11-19
14:25
Osaka   Performance Degradation of Photovoltaic Modules with Rapid Thermal-Cycling
Yuichi Aoki, Manabu Okamoto (Espec Corp.), Atsushi Masuda, Takuya Doi (AIST) R2010-33
To clarify the failure-mode of crystalline-silicon photovoltaic modules on the thermal-cycle test, the modules were expo... [more] R2010-33
pp.5-8
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