IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 107, Number 270

Reliability

Workshop Date : 2007-10-19 / Issue Date : 2007-10-12

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Table of contents

R2007-37
Estimation for the sample size in incomplete data cases
Hideo Hirose (Kyushu Inst. of Tech.)
pp. 1 - 6

R2007-38
Steady state probability of a priority AND gate considering the restoration of input events
Shinya Ozeki, Tetsushi Yuge, Nobuyuki Tamura, Shigeru Yanagi (N.D.A)
pp. 7 - 12

R2007-39
Toward evaluating reliability of a decentralized railway interlocking system
Xinhong Hei, Sei Takahashi, Hideo Nakamura (Nihon Univ.)
pp. 13 - 17

R2007-40
Error Estimations of Flowmeters using Failure Diagnostics Results Based on Control Limits
Takeshi Kishikawa, Naoki Kimura, Yoshifumi Tsuge (Kyushu Univ.)
pp. 19 - 24

R2007-41
Design of a computer-aided system to select appropriate inspection points for CUI in petrochemistry plants
Masashi Harada, Shigeyuki Tateno, Hisayoshi Matsuyama (Waseda Univ.)
pp. 25 - 30

R2007-42
Development of simulator of pressure control system for air-conditioning equipment in design review stage
Kazuho Hirama (Waseda Univ.), Nobuhiro Tanaka, Takayuki Miyake (MEC), Shigeyuki Tateno, Hisayoshi Matsuyama (Waseda Univ.)
pp. 31 - 36

R2007-43
Design of a computer aided PC selection reflecting customers' demands
Yudai Shimizu, Shigeyuki Tateno, Hisayoshi Matsuyama (Waseda Univ.)
pp. 37 - 40

R2007-44
An investigation on the reliability simulation of electric power supply system
Hitoshi Watanabe (Tokyo Univ. of Science), Seiichi Muroyama (NTT-FRI), Takashi Takeda (NTT Facilities, Inc.)
pp. 41 - 45

R2007-45
A Low Overhead Dependable Microcontroller Architecture with Instruction-level Rollback for Soft Error Recovery
Teruaki Sakata, Teppei Hirotsu, Hiromichi Yamada (Hitachi), Takeshi Kataoka (Renesas)
pp. 47 - 52

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan