Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380
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R2008-44
Contact resistance analysis of electric contact with tin or silver plated layer
Shigeru Sawada (Mie Univ.), Kaori Shimizu, Yasuhiro Hattori (AutoNetworks Tech, Ltd.), Terutaka Tamai (Mie Univ.)
pp. 1 - 6
R2008-45
Growth Law of the Oxide Film Formed on the tin Plated Contact Surface and Its Contact Resistance Characteristic
-- Study applied by ellipsometry --
Yuya Nabeta, Yasushi Saitoh, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (AutoNetworks Tech, Ltd.), Terutaka Tamai (Mie Univ.)
pp. 7 - 12
R2008-46
Influence of Aging on Contact Resistance Characteristics of Tin Plated Contacts
Yuichi Tominaga, Takuya Yamanaka, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Yasuhiro Hattori (AutoNetworks Tech, Ltd.)
pp. 13 - 18
R2008-47
Influence of Fretting Corrosion on Lifetime of Tin Plated Connectors
Daiji Ito, Hirosaka Ikeda, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Tetsuya Ito, Yasuhiro Hattori (Auto Networks Tech, Ltd)
pp. 19 - 24
R2008-48
Microscopy Study of Fretting Corrosion of the Tin Plated Contacts
Tetsuya Ito, Shigeru Sawada, Yoshiyuki Nomura (ANTAutoNetworks Tech, Ltd.), Yasuhiro Hattori (AutoNetworks Tech, Ltd.), Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.)
pp. 25 - 30
R2008-49
An experimental study on evaluation system for contact surraces with an optical-cross method
Makoto Kashiwakura, Shunsuke Kudo, Asuka Sudo, Makoto Hasegawa (Chitose Inst. of Sci. & Tech.)
pp. 31 - 36
R2008-50
Degradation phenomenon of electrical contacts by hammering oscillating mechanism
-- for Contact Resistance (IV) --
Shin-ichi Wada, Taketo Sonoda, Keiji Koshida, Mitsuo Kikuchi, Hiroaki Kubota (TMC System), Koichiro Sawa (Keio Univ.)
pp. 37 - 42
R2008-51
Pull strength analysis of Pb free solder at a connected point
Taku Hashiguchi, Yuta Nasukawa, Kazunori Hiraoka (Salesian Polytecn.)
pp. 43 - 48
R2008-52
Evaluation of electric contact trouble caused by silicone.
-- Evaluation test with new environmental examination device --
Makito Morii, Hiroyuki Moriwaki (OMRON), Hideki Tanaka, Yoshitaka Ueki, Kenji Suzuki, Kimio Yoshizumi, Masanobu Nishikawa (espec)
pp. 49 - 52
R2008-53
Dependency of Occurrence of Contact Failure due to Silicone Contamination on Electrical Load Conditions
Terutaka Tamai (Mie Univ.)
pp. 53 - 58
R2008-54
An experimental study on influences of silicone-type and non-silicone-type polymeric materials on contact resistance characteristics of relay contacts
Makoto Hasegawa, Takuma Matsuto (Chitose Inst. of Sci. & Tech.), Yoshiyuki Kohno, Hiroshi Ando (Kaneka Corp.)
pp. 59 - 64
R2008-55
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Sadanori Ito (Itoken office)
pp. 65 - 68
R2008-56
Avoidance for lightning damages on the stray metal portion of the broadcasting system
Kazuaki Wakai (Daiichi Univ.), Yuji Sawaguri (SGC)
pp. 69 - 76
R2008-57
Reliability test results for SC and MU connectors installed on outside plant
Yoshiteru Abe, Shuichi Yanagi, Shuichiro Asakawa, Ryo Nagase (NTT)
pp. 77 - 81
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.