Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380
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EMD2008-120
Contact resistance analysis of electric contact with tin or silver plated layer
Shigeru Sawada (Mie Univ.), Kaori Shimizu, Yasuhiro Hattori (AutoNetworks Tech, Ltd.), Terutaka Tamai (Mie Univ.)
pp. 1 - 6
EMD2008-121
Growth Law of the Oxide Film Formed on the tin Plated Contact Surface and Its Contact Resistance Characteristic
-- Study applied by ellipsometry --
Yuya Nabeta, Yasushi Saitoh, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (AutoNetworks Tech, Ltd.), Terutaka Tamai (Mie Univ.)
pp. 7 - 12
EMD2008-122
Influence of Aging on Contact Resistance Characteristics of Tin Plated Contacts
Yuichi Tominaga, Takuya Yamanaka, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Yasuhiro Hattori (AutoNetworks Tech, Ltd.)
pp. 13 - 18
EMD2008-123
Influence of Fretting Corrosion on Lifetime of Tin Plated Connectors
Daiji Ito, Hirosaka Ikeda, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Tetsuya Ito, Yasuhiro Hattori (Auto Networks Tech, Ltd)
pp. 19 - 24
EMD2008-124
Microscopy Study of Fretting Corrosion of the Tin Plated Contacts
Tetsuya Ito, Shigeru Sawada, Yoshiyuki Nomura (ANTAutoNetworks Tech, Ltd.), Yasuhiro Hattori (AutoNetworks Tech, Ltd.), Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.)
pp. 25 - 30
EMD2008-125
An experimental study on evaluation system for contact surraces with an optical-cross method
Makoto Kashiwakura, Shunsuke Kudo, Asuka Sudo, Makoto Hasegawa (Chitose Inst. of Sci. & Tech.)
pp. 31 - 36
EMD2008-126
Degradation phenomenon of electrical contacts by hammering oscillating mechanism
-- for Contact Resistance (IV) --
Shin-ichi Wada, Taketo Sonoda, Keiji Koshida, Mitsuo Kikuchi, Hiroaki Kubota (TMC System), Koichiro Sawa (Keio Univ.)
pp. 37 - 42
EMD2008-127
Pull strength analysis of Pb free solder at a connected point
Taku Hashiguchi, Yuta Nasukawa, Kazunori Hiraoka (Salesian Polytecn.)
pp. 43 - 48
EMD2008-128
Evaluation of electric contact trouble caused by silicone.
-- Evaluation test with new environmental examination device --
Makito Morii, Hiroyuki Moriwaki (OMRON), Hideki Tanaka, Yoshitaka Ueki, Kenji Suzuki, Kimio Yoshizumi, Masanobu Nishikawa (espec)
pp. 49 - 52
EMD2008-129
Dependency of Occurrence of Contact Failure due to Silicone Contamination on Electrical Load Conditions
Terutaka Tamai (Mie Univ.)
pp. 53 - 58
EMD2008-130
An experimental study on influences of silicone-type and non-silicone-type polymeric materials on contact resistance characteristics of relay contacts
Makoto Hasegawa, Takuma Matsuto (Chitose Inst. of Sci. & Tech.), Yoshiyuki Kohno, Hiroshi Ando (Kaneka Corp.)
pp. 59 - 64
EMD2008-131
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Sadanori Ito (Itoken office)
pp. 65 - 68
EMD2008-132
Avoidance for lightning damages on the stray metal portion of the broadcasting system
Kazuaki Wakai (Daiichi Univ.), Yuji Sawaguri (SGC)
pp. 69 - 76
EMD2008-133
Reliability test results for SC and MU connectors installed on outside plant
Yoshiteru Abe, Shuichi Yanagi, Shuichiro Asakawa, Ryo Nagase (NTT)
pp. 77 - 81
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.