IEICE Technical Report

Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380

Electromechanical Devices

Workshop Date : 2011-01-28 / Issue Date : 2011-01-21

EMD2010-135
A Discussion on Carbon Arc V-I Characteristics
Keiichi Suhara (TNCT)
pp. 1 - 4

EMD2010-136
Three-Dimensional Micro-Structural Study of Tin Plated Fretting Contacts
Tetsuya Ito, Shigeru Ogihara, Yasuhiro Hattori (ANT)
pp. 5 - 10

EMD2010-137
Measurement of Contact Resistance Distribution in Fretting Corrosion Track for the Tin Plated Contacts
Soushi Masui, Shigeru Sawada, Terutaka Tamai (Mie Univ), Yasuhiro Hattori (AN-Tech), Kazuo Iida (Mie Univ)
pp. 11 - 16

EMD2010-138
Fretting characteristics about the shape and weight of tin-plated contacts
Tomishige Tai, Tetsuya Komoto (JAE)
pp. 17 - 21

EMD2010-139
Design of Optical Rotary Link Joint Using Coaxial Multi-core Plastic Optical Fiber
Kazuya Kaba, Makoto Kawashima (Chubu Univ), Shunsuke Kawabata (Ihara Electronic), Seiji Sashou (Asahi Kasei E-materials)
pp. 23 - 27

EMD2010-140
Effects of resin-clay nanocomposites on the ionic migration inhibitors in Ag-printed circuits
Yasuyuki Ohtani, Shin-ichiro Nakajima (JAE)
pp. 29 - 34

EMD2010-141
Degradation phenomenon of electrical contacts by a tapping device -- A tapping device for trial (1) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masahiro Kawanobe, Daiki Ishizuka, Kunio Yanagi, Masayoshi Kotabe, Hiroaki Kubota (TMC), Nobuhiro Kuga (Yokohama Nat'l Univ.), Koichiro Sawa (NIT)
pp. 35 - 40

EMD2010-142
Degradation phenomenon of electrical contacts by a tapping device -- A tapping device for trial (2) --
Keiji Koshida, Shin-ichi Wada, Saindaa Norovling, Masahiro Kawanobe, Masayoshi Kotabe, Hiroaki Kubota (TMC), Nobuhiro Kuga (Yokohama Nat'l Univ.), Koichiro Sawa (NIT)
pp. 41 - 46

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan