IEICE Technical Report

Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380

Electromechanical Devices

Workshop Date : 2012-01-20 / Issue Date : 2012-01-13

EMD2011-112
Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- Contact Resistance and its model (20) --
Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT)
pp. 1 - 6

EMD2011-113
Relationship between moving range of break arcs and radius of curvature of electrical contacts in a DC48V circuit
Toru Sugiura, Junya Sekikawa, Takayoshi Kubono (Shizuoka Univ.)
pp. 7 - 12

EMD2011-114
Dependences of Surface Condition and Contact Resistance Eroded by Break Arcs on Contact Opening Speed
Katsuyoshi Miyaji, Junya Sekikawa, Takayoshi Kubono (Shizuoka Univ)
pp. 13 - 18

EMD2011-115
Non-Contact PIM Characteristic Evaluation of Printed Circuit Boards using the Standing Coaxial Tube Method
Keita Hoshino, Daijiro Ishibashi, Kensuke Saito, Nobuhiro Kuga (Yokohama Nat'l Univ.)
pp. 19 - 24

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan