IEICE Technical Report

Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380

Reliability

Workshop Date : 2014-12-19 / Issue Date : 2014-12-12

R2014-65
A study on the derivation of connected-(r, s)-out-of-(m, n):F system reliability
Taishin Nakamura, Xiao Xiao (TMU), Tomoaki Akiba (CIT), Hisashi Yamamoto (TMU)
pp. 1 - 6

R2014-66
A Note on Optimal Schedule for Applying Security Patches
Chao Luo, Hiroyuki Okamura, Tadashi Dohi (Hiroshima Univ.)
pp. 7 - 11

R2014-67
Availability Measure of One-shot Systems with Minimal Repair
Tomohiro Kitagawa, Tetsushi Yuge, Shigeru Yanagi (NDA)
pp. 13 - 18

R2014-68
A consideration of the network reliability model for disaster risk reduction
Hitoshi Watanabe, Pingguo Huang (Tokyo Univ. of Science)
pp. 19 - 24

R2014-69
Aims and Key Issues of the Revision of JIS Z 8115 Dependability (Reliability) Terms -Part 2-
Ko Kawashima (ORIENTAL MOTOR), Akihiko Masuda (Tokyo Univ. of Science), Tateki Nishi (DNV GL Business Assurance Japan), Hiroyuki Goto (FDK)
pp. 25 - 28

R2014-70
Trend on standardization of dependability -- Outline of IEC TC56 and agenda on international meeting --
Hiroyuki Goto (FDK), Yoshinobu Sato (JACO), Yoshiki Kinoshita, Makoto Takeyama (KU)
pp. 29 - 34

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan