IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 115, Number 175

Dependable Computing

Workshop Date : 2015-08-05 / Issue Date : 2015-07-29

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Table of contents

DC2015-22
Testbeds of a Highly Reliable Method for CANs in High Electromagnetic Environments
Muneyuki Nakamura, Mamoru Ohara (Tokyo Metropolitan Univ.), Masayuki Arai (Nihon Univ.), Aromhack Saysanasongkham, Kazuya Sakai, Satoshi Fukumoto (Tokyo Metropolitan Univ.)
pp. 1 - 8

DC2015-23
Fast single stream secure transport using AES-CTR mode
Takeshi Fukunaga, Kei Hiraki (UTokyo)
pp. 9 - 14

DC2015-24
Topology Alterable NoC with fault tolerance
Seiichi Tade (Keio Univ.), Michihiro Koibuchi (NII), Hiroki Matsutani, Hideharu Amano (Keio Univ.)
pp. 15 - 20

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan