Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380
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EMCJ2017-64
Analysis for Skin Surface Temperature Rise Under Convergence Beam Exposure of 40GHz and 95GHz Millimeter Wave
Hiroki Sakiyama, Atsuhiro Nishikata (Titech), Kensuke Sasaki (NICT), Yoshikazu Ugawa (FMU)
pp. 1 - 6
EMCJ2017-65
A Study on Broadband Operation of Feedback-Type Common-Mode Noise Suppressor Using Two Ferrite Cores
Soichiro Yoshikawa, Atsuhiro Nishikata (Tokyo Tech), Farhan Mahmood (NTT)
pp. 7 - 11
EMCJ2017-66
Evaluation of the Influence of Reflection from Wave Absorber to Body Area Measurement in Anechoic Chamber Using RMS Time Delay
Kosorl Thourn, Takahiro Aoyagi, Jun-ichi Takada (TokyoTech)
pp. 13 - 16
EMCJ2017-67
A Study on Suppression of Magnetic Near-Field above a Trace by Shielding Material with SRR Structure
Riku Sato (Akita Univ.), Yoshiki Kayano (UEC), Motoshi Tanaka (Akita Univ.)
pp. 17 - 22
EMCJ2017-68
Magnetic Near-Field Noise Measurement and Improvement of Power Efficiency of LED Bulb without Switching Circuit
Shunsuke Koyanagi (Akita Univ.), Katsutoshi Saito (Saikatu), Motoshi Tanaka (Akita Univ.)
pp. 23 - 28
EMCJ2017-69
Analysis of the Relation between Arc Power and Radiated Electromagnetic Noise
Shingo Shimizu, Shinji Ohoka (SOKEN), Yoshihiro Adachi (DENSO)
pp. 29 - 33
EMCJ2017-70
Improvement of Noise Source Amplitude Modulation Method to Identify Source Devices of Electromagnetic Interference
Chiaki Ishida, Shinpei Yoshino, Chiaki Ogawa, Kengo Iokibe, Yoshitaka Tyota, Yasuyuki Nogami (Okayama Univ.)
pp. 35 - 40
EMCJ2017-71
Study on the Effect of Clock Rise Time on Fault Occurrence under IEMI
Takuya Itoh (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.)
pp. 41 - 44
EMCJ2017-72
A study on dynamic characteristic measurement method for power electronics circuit applying wide band gap semiconductor device
Kei Hayashi, Tsuyoshi Funaki, Takaaki Ibuchi (Osaka Univ.)
pp. 45 - 50
EMCJ2017-73
Non-Contact Measurement of Common Mode Load Impedance of Wire Harness upto High Frequencies based on Transmission Line Concept
Tomohiro Yoshikawa, Jianqing Wang (NIT), Yasunori Oguri, Makoto Tanaka, Michihira Iida (DENSO)
pp. 51 - 56
EMCJ2017-74
A Study on Evaluation Method for EM Information Leakage Utilizing Controlled Image Displaying
Gentaro Tanabe (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.)
pp. 57 - 62
EMCJ2017-75
Efficient Evaluation Method for Information Leakage of Cryptographic Devices Based on Frequency Selection
Airi Sugimoto (Tohoku Univ.), Daisuke Fujimoto, Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.)
pp. 63 - 66
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.