Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380
[TOP] | [2014] | [2015] | [2016] | [2017] | [2018] | [2019] | [2020] | [Japanese] / [English]
SS2017-64
Model Checking Application to the Railway Crossing Problem for STAMP/STPA using Timed Automaton
Kozo Okano, Shinpei Ogata, Pan Yang (Shinshu Univ.), Keishi Okamoto (Sendai National College of Tech.)
pp. 1 - 6
SS2017-65
A symbolic Zone-based reachability analysis for dense-timed pushdown automata with freezing clocks
Shoji Yuen, Sho Hiraoka (Nagoya Univ.)
pp. 7 - 12
SS2017-66
Packer identification based on Malware analyzer BE-PUM
Mizuhito Ogawa (JAIST)
pp. 13 - 16
SS2017-67
(See Japanese page.)
pp. 17 - 22
SS2017-68
An Investigation into the Characteristics of Source Code for Supporting Inline Method
Yuki Yamada, Kyohei Uemura, Eunjong Choi (NAIST), Norihiro Yoshida (Nagoya Univ.), Hajimu Iida (NAIST)
pp. 23 - 27
SS2017-69
Junnosuke Matsumoto, Yoshiki Higo, Kento Shimonaka, Shinji Kusumoto (Osaka Univ.)
pp. 29 - 34
SS2017-70
Toward Visualization of Discussions about Software Quality in OSS Development
Shunta Nakanishi, Eunjong Choi, Hajimu Iida (NAIST)
pp. 35 - 38
SS2017-71
Hiroto Tanaka, Shinsuke Matsumoto, Shinji Kusumoto (Osaka Univ.)
pp. 39 - 44
SS2017-72
Ryo Arima, Yoshiki Higo, Shinji Kusumoto (Osaka Univ.)
pp. 45 - 50
SS2017-73
(See Japanese page.)
pp. 51 - 56
SS2017-74
A Determination Method of Locality Sensitive Hashing Parameters for Code Clone Detection
Shogo Tokui (Osaka Univ.), Norihiro Yoshida (Nagoya Univ.), Eunjong Choi (NAIST), Katsuro Inoue (Osaka Univ.)
pp. 57 - 62
SS2017-75
Termination Verification of Functional Programs via Regression Prediction of Ranking Function
Daiki Muramoto, Ryosuke Sato, Naoyasu Ubayashi, Yasutaka Kamei (Kyushu Univ.)
pp. 63 - 68
SS2017-76
Suggestion of Test Case Generation Method with Priority Based on Use Case of User for System Test
Emi Saito, Ai Toshikuni, Yuichiroh Nakagawa (Hitachi)
pp. 69 - 74
SS2017-77
Uncertainty in Machine Learning Software from Quality Assurance Viewpoints
Shin Nakajima (NII)
pp. 75 - 80
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.